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The role of small-impact-parameter electron-loss processes on ion temperatures measured by active-beam plasma diagnostics (1989)

Donné, A. J. H. ; de Heer, F. J. ; Olson, R. E.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 65 (1989), S. 57-63

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The shape of the energy distribution of scattered particles in an active-beam scattering experiment can be influenced considerably by the presence of highly charged impurity ions in the plasma. In this work it is shown theoretically that multiply charged impurities have only a small effect on the scattering distribution at low energies (〈10 keV/amu) and at high energies (〉75 keV/amu). The effect of the impurities is the most pronounced for energies close to 50 keV/amu. The results of the calculations are in good agreement with experimental results at various energies. Extrapolation to higher beam energies leads to the conclusion that the active-beam scattering diagnostics can be applied also in future fusion devices for measuring the local ion temperature.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.343375

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