ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Charge-collection measurements on test structures were carried out for events induced by alphas, heavy ions, and proton-induced nuclear reactions over a variety of bias values and for two doping levels. Analysis of charge-collection pulse-height spectra provides the shape and dimensions of the sensitive volume associated with the single-event upset (SEU) sensitive junctions. The critical charge is determined by the circuit design. The critical charge and the dimensions of the sensitive volume are required by all the existing codes dealing with the calculation of SEU rates in natural space environments. The dimensions of the sensitive volume determined for some Rockwell GaAs test structures were used in simulations of charge collection by proton-induced nuclear reactions using the Clemson University Proton Interactions in Devices codes. Comparison of the results with experimental data yields agreement.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.347688
