ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Defect states in ZnSe single crystals induced by 60Co γ-ray irradiation have been investigated with deep-level transient spectroscopy (DLTS) and optical deep-level transient spectroscopy (ODLTS). 5-MeV-electron-irradiated crystals have also been examined for comparison. With DLTS measurements it is found that two electron traps at Ec − 0.27 eV and Ec − 0.49 eV are newly introduced, and the concentration of an electron trap at Ec − 0.30 eV, which exists in unirradiated ZnSe, is increased by γ-ray or electron irradiation. Two additional electron traps located at Ec − 0.15 eV and Ec − 0.79 eV are also observed, and are unique to the γ-ray and the 5-MeV-electron-irradiated material, respectively. In ODLTS spectra a newly introduced hole trap at Ev+0.71 eV and the increase in the concentration of a trap at Ev+0.19 eV are observed in the ZnSe irradiated with γ ray or 5 MeV electron. It is concluded that the electron trap at Ec−0.30 eV and the hole trap at Ev+0.71 eV are attributed to a Se and Zn vacancy-associated defect in the ZnSe single crystal, respectively. The hole trap at Ev +0.19 eV is tentatively identified as arising from an impurity Se vacancy complex.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.347711
