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YBa2Cu3O7−y/Y2BaCuO5 composites: Growth and characterization (1993)

Broussard, P. R. ; Allen, L. H. ; Cestone, V. C. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 74 (1993), S. 446-450

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: We have prepared thin film composites of Y1Ba2Cu3O7−y ("123'') and Y2Ba1Cu1O5 ("211'') by off-axis sputtering from separate targets of the 123 and 211 material. X-ray diffraction on the films shows the presence of c-axis oriented 123, and (00L) ordered Y2O3, but no indication of 211 lines. The c-axis lattice constant does not show any change compared to our pure 123 films. As the volume percentage of 211 material increases, we see a reduction in Tc and Jc, and an increase in the resistivity. The temperature and field dependence of the critical current are different for our composites compared to our pure 123 films.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.355278

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