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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 7461-7471 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The understanding of the phenomena of ferroelectricity requires profound knowledge of the ferroelectric domain structure. In this paper we report on the progress of studying ferroelectric domains and domain walls with scanning force microscopy (SFM). Domains and domain walls of ferroelectric crystals of guanidinium aluminum sulfate hexahydrate (GASH) are imaged with SFM. Two sets of complementary results are obtained depending on the operation mode of the instrument. In the non-contact imaging mode (attractive force regime), domain walls are imaged. In the contact imaging mode (repulsive force regime) in addition to the domain wall structure, information about the polarity of the domains is obtained. In these latter images, the opposing contrast of the ferroelectric positive and negative domains is superimposed on the GASH cleavage structure. The imaging mechanism of the contact and noncontact modes are discussed. Corroborating scanning electron microscopy images are presented as well.
    Type of Medium: Electronic Resource
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