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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 2008-2013 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: By use of transmission electron microscopy and x-ray diffraction the degradation of the structure of epitaxial crystalline Mo–V multilayers has been studied during annealing between 1000 and 1250 K. In low vacuum (10−4 mbar), first, a polygonization (driven by the elastic mismatch due to the oxidation of V) took place, which led to a grain size in the order of the thickness of the individual layers (i.e., 1–2 nm). At longer annealing times, a partial recrystallization of Mo—parallel with a grain-boundary assisted discontinuous structural transformation—was observed. The (200) texture was preserved during the degradation process. At low temperatures and in low vacuum, this process was fast, while with improving the vacuum (up to 10−7 mbar) the polygonization was slower and above 1200 K the bulk diffusion controlled intermixing was observed with a final state of completely homogeneous solid solution. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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