Digitale Medien
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
86 (1999), S. 4049-4051
ISSN:
1089-7550
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
Low energy ion-induced secondary electron emission from the surface of thin (500–5000 Å) polycrystalline MgO films has been investigated with various noble gas ions at energies ranging from 45 to 300 eV. The dependence of secondary electron emission coefficient γi on the type and energy of ions is reported and interpreted in terms of electron ejection mechanisms. As-deposited MgO films showed an initial fluctuation in the secondary emission current, which upon annealing or after a certain ion bombardment time irreversibly disappeared. © 1999 American Institute of Physics.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.371328
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