Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
90 (2001), S. 1201-1207
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Measurement of the stress history at a Lagrangian position in a shocked solid has been accomplished by various means including the embedding of a thin metal piezoresistive gauge to equilibrate with the ambient conditions and register a component of the field around it. Some work has shown that such sensors may be used to show the decay of the elastic precursor amplitude recorded within a material with the distance travelled by the wave into it. Recent doubt has been placed upon the validity of such observations by pointing to an apparent increase in stress at small distances being due to an overshoot in the gauge record that results from a finite response time [J. Appl. Phys. 88, 5666 (2001)]. An analysis is presented to indicate in which regimes such effects may be important. It is compared with experiment to show the validity of the model developed. Additionally, it is used to show that some of the measured precursor decay may be a physical phenomenon in certain polycrystalline aluminas. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1383584
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