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    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 2351-2353 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The resolution of the scanning electron microscope can be improved by mounting the sample in the high-field region of a condenser-objective lens. Low-loss electrons (LLEs) are scattered from the sample with an energy loss of less than a few percent of the incident energy. In the past, LLEs have been collected with a retarding-field energy filter. A way has been found to collect LLEs using a detector located within the magnetic field of the condenser-objective lens which provides the required energy-filtering action. This greatly simplifies the apparatus and makes it possible to obtain LLE images with less tilt of the specimen and with a higher beam energy than before.
    Type of Medium: Electronic Resource
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