Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
57 (1990), S. 2612-2614
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Quantitative image interpretation in magnetic force microscopy requires information about the geometric and magnetic configuration of the employed microprobe. If the magnetic microfield of a given sample is known in detail, a calibration of the probe is possible. Using the well-defined current-induced microfield of a nanolithographically structured conducting pattern, calibration measurements combined with model calculations provide an insight into the effective domain configuration of magnetic force microscopy probes.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.103827
|
Location |
Call Number |
Expected |
Availability |