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Charge redistribution in the multiple levels of the DX center (1991)

Su, Z. ; Farmer, J. W.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 59 (1991), S. 1746-1748

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: The multiple DX levels are studied by using the rate-window scan method of deep level transient spectroscopy. It is found that the electron concentrations in the individual DX levels do not always increase monotonically with filling time, showing a charge redistribution effect. This charge redistribution in the DX levels indicates that the DX center is negatively charged and that each defect site is able to generate multiple states in different levels. The charge redistribution effect unambiguously rules out all existing small lattice relaxation models, while it is understood within the broken-bond negative U model.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.106238

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