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Enhancement of diffusion-induced grain boundary migration by ion irradiation (1993)

Alexander, Dale E. ; Rehn, L. E. ; Baldo, P. M. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 62 (1993), S. 1597-1599

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Diffusion-induced grain boundary migration (DIGM) was observed in Au/Cu bilayers irradiated with 1.5 MeV Kr at T≥400 K. Rutherford backscattering spectrometry (RBS) showed nearly uniform distributions of Cu present throughout polycrystalline Au films after irradiation and after annealing treatments. Irradiation increased the amount of Cu relative to annealed-only areas. Cross-section transmission electron microscopy combined with x-ray energy dispersive spectroscopy (XEDS) identified alloyed zones (14–20 at. % Cu), confirming DIGM in the Au film of an ion bombarded bilayer. A description of DIGM is presented relating RBS measurements of the film-averaged Cu composition with treatment time, average grain size, and film thickness. Application of this model to the experimental results in combination with XEDS work indicates that irradiation enhances DIGM by increasing the grain boundary velocity.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.108597

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