Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
65 (1994), S. 2798-2800
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The constant photocurrent spectra (CPM) have been measured in a series of undoped a-Si:H/a-Si1−xCx:H multilayers with different thickness (db) of the a-Si1−xCx:H barrier layers from 5 to 100 A(ring). It is found that the apparent defect absorption and the apparent Urbach energy in the CPM spectra increase monotonically with db. These results show that the interface properties are strongly affected by the barrier layer thickness. The interface defect density, as evaluated from the CPM spectra, increases from 5×109 to 9×1011 cm−2 with db. © 1994 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.112569
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