Digitale Medien
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
72 (1998), S. 317-319
ISSN:
1077-3118
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
The variation of the relative permittivity of charged dielectrics with trapped charge density has been investigated by a time-resolved current method, in conjunction with a mirror image method employing a scanning electron microscope. The calculation is made by a mathematical expression derived from classical electromagnetic theory. It is found that the relative permittivity of the charged area in the polymethylmethacrylate sample increases with the trapped charge density and saturates at a certain value of the trapped charge density. These observations have been discussed by analogy with the dielectric saturation occurring at a high applied external electric field. © 1998 American Institute of Physics.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.120723
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