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Nanoscale fracture studies using the scanning force microscope (2001)

Baumeister, Bettina ; Jung, Thomas A.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 78 (2001), S. 2485-2487

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: We present a variety of experiments concerning friction and fracture mechanisms using two-dimensional arrays of microfabricated nanotowers as templates. The scanning force microscope tip is used as a tool to apply well-defined forces to the surface of the patterned substrate. Force statistic measurements reveal information about the forces involved in the fracture process and the probability of fracture of selected towers. These methods are discussed in the context of nanometer-scale mechanisms. Using optimized parameters, a controlled removal of individual nanotowers and the ability to "write" predefined patterns on a nanometer scale can be achieved. © 2001 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1367297

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