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Low propagation losses of an Er:Y2O3 planar waveguide grown by alternate-target pulsed laser deposition (2001)

Korzenski, M. B. ; Lecoeur, Ph. ; Mercey, B.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 78 (2001), S. 1210-1212

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: We report on waveguiding properties in epitaxial Er:Y2O3 films grown by pulsed-laser deposition on sapphire [0001] substrate. Characterization of the as-grown films by x-ray diffraction, atomic force microscopy, and Rutherford backscattering revealed that the films were highly crystalline and textured along the [111] direction and possessed an average surface roughness of 2 nm for a 0.69-μm-thick film. The investigation of the emission spectra confirms the proper structural position for the Er3+ ions in the Y2O3 matrix and that the films guide optical waves along the entire length (5 mm) of the film yielding a propagation loss of 〈1 dB/cm at 800 nm. © 2001 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1347026

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