Electronic Resource
Amsterdam
:
Elsevier
Optics and Laser Technology
17 (1985), S. 189-192
ISSN:
0030-3992
Keywords:
fringes
;
image processing
;
interferometry
;
speckle
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0030-3992(85)90085-4
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