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Interpreting oscillatory Bragg peak positions (1996)

Dragoi, D. ; Watkins, T. R. ; Kozaczek, K. J.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 29 (1996), S. 493-494

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: This work describes a detector-fixed method in which X-ray photons are collected on different points of the sensitive area of the detector without movement of the detector and which is suitable for measuring a single-crystal orientation using (ω, φ) rotations. This method was used to determine the orientation of a silicon wafer whose (100) plane makes a small angle (misorientation angle) with the surface. ω scans of the 400 reflection were measured as a function of φwhile χ and 2θ were fixed at 0 and 69°, respectively.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889896000684

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