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  • 1
    Electronic Resource
    Electronic Resource
    A method for precision lattice-parameter measurement of single crystals (1984)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 17 (1984), S. 451-455 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A method for precise measurement of diffraction angles of single crystals using a Soller slit is described, which needs only a single diffracting position of the sample. The method can be applied to imperfect crystals, to samples with arbitrary shape as well as to measurements integrating over a larger area. The instrument and the measuring procedure are described. A survey of systematic errors is given and the errors that are specific for the method are briefly discussed. As an example, the results of measurements on silicon with a standard deviation of 3 p.p.m. are communicated.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889884011912
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