ISSN:
1399-0047
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
The white-beam Laue-diffraction method is a useful tool for rapid measurement of crystallographic intensities with synchrotron radiation. Considerations of the signal-to-noise ratio to be expected from scattering of X-rays within a limited wavelength range suggest that it will pay to limit that range to something like an octave. This rule-of-thumb has the added advantage that there will be significantly fewer diffraction spots that are overlapping harmonics of one another. To maximize the number of reflections recorded in a single stationary-crystal exposure, one should choose this octave of wavelengths in a region where the curvature of the Ewald sphere is greatest, that is at the longest wavelength allowable after other considerations are taken into account.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0907444992012095
