Electronic Resource
[S.l.]
:
International Union of Crystallography (IUCr)
Acta crystallographica
44 (1988), S. 22-25
ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
Absolute measurements of the 200 reflection in Si and Ge at various azimuthal orientations are compared with N-beam calculations of the integrated intensity. All of the non-zero integrated intensity is accounted for by multiple-beam scattering. The measurements match the calculations on the assumption that F200 = 0.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0108767387008006
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