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    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 36 (1980), S. 1065-1070 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A systematic investigation of the effect of phase errors of different types on E maps is presented. Both random and systematic errors have been considered with distributions depending in different ways on the resolution of the data. Considerably large random errors can be tolerated without great loss of structural information in the E maps, while smaller systematic errors have greater destructive effects. These effects are explained by the introduction and analysis of a phase-error function.
    Type of Medium: Electronic Resource
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