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Effect of dispersion on the probability distribution of X-ray reflexions (1980)

Wilson, A. J. C.

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 36 (1980), S. 945-946

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ISSN: 1600-5724

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Chemistry and Pharmacology , Geosciences , Physics

Notes: If dispersive atoms are present the structure factor of a centrosymmetric crystal is not purely real, and the probability distribution of the modulus of the structure factor becomes P(F)dF = ( 2F/μ) exp (-ΣF2/μ2)I0(SF2/μ2)dF, where Io is the modified Bessel function of zero order, Σ is the sum of the squares of the moduli of the atomic scattering factors, S is the modulus of the sum of their squares, and μ is (Σ2 - S2)1/2. For a non-centrosymmetric crystal the form of the distribution is not altered, but Σ must be defined as in the preceding sentence.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0567739480001957

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