Electronic Resource
[S.l.]
:
International Union of Crystallography (IUCr)
Acta crystallographica
36 (1980), S. 442-450
ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
Formulas are derived extending several semi-empirical absorption-correction methods to diffractometers operating in Weissenberg geometries, with particular attention paid to flat-cone geometry. These formulas are useful for a variety of instruments using both area and linear position-sensitive detectors. While a complete data set can sometimes be corrected using a single absorption reflection, it was found that the best corrections are usually obtained by considering two absorption reflections rather than one. A discussion of the optimum choice of absorption correction when a crystal has at least a twofold symmetry axis is presented. The accuracy of the methods and the limits of applicability have been examined by computer simulations.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0567739480000952
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