ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
The intensity of X- ray scattering from f.c.c. crystals containing extrinsic stacking faults with two fault parameters [see Howard (1977). Acta Cryst. A33, 29-32] has been calculated.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0567739478001709