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Accuracy in film-scanner intensity measurements (1970)

Werner, P. E.

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 26 (1970), S. 489-491

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ISSN: 1600-5724

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Chemistry and Pharmacology , Geosciences , Physics

Notes: The accuracy in X-ray diffraction intensities obtained by the use of an automatic IBM 1800-controlled SAAB film scanner is discussed. The random errors have been found to be around 4% of the intensities for most reflexions. By comparison with data obtained from a Joyce–Loebl microdensitometer it has been found that there are no serious systematic errors in the film-scanner data. Measurements from Weissenberg and precession films are discussed.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0567739470001286

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