Electronic Resource
Springer
Fresenius' journal of analytical chemistry
365 (1999), S. 263-268
ISSN:
1432-1130
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Abstract Nanoscale cobalt-copper multilayers prepared by pulsed laser deposition on oxidized silicon substrate were investigated by means of transmission electron microscopic (TEM) methods combined with energy dispersive X-ray spectroscopy. The multilayers proved to be polycrystalline with grain sizes between some nanometers and the stack thickness. The topmost copper layer was incomplete with droplets up to 1 μm. For single layer thicknesses greater than 4 nm it could be shown that the structure of the layer stacks was face centred cubic with hexagonal close packed parts in the cobalt layers.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s002160051485
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