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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Fresenius' journal of analytical chemistry 365 (1999), S. 263-268 
    ISSN: 1432-1130
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Nanoscale cobalt-copper multilayers prepared by pulsed laser deposition on oxidized silicon substrate were investigated by means of transmission electron microscopic (TEM) methods combined with energy dispersive X-ray spectroscopy. The multilayers proved to be polycrystalline with grain sizes between some nanometers and the stack thickness. The topmost copper layer was incomplete with droplets up to 1 μm. For single layer thicknesses greater than 4 nm it could be shown that the structure of the layer stacks was face centred cubic with hexagonal close packed parts in the cobalt layers.
    Type of Medium: Electronic Resource
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