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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Materials research innovations 3 (2000), S. 250-262 
    ISSN: 1433-075X
    Keywords: Key words Small-specimen testing ; Controlled-flaw method ; Fracture toughness ; Brittle materials ; Finite element analysis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: ∞ is the crack resistance at ”infinite” crack length. It is convincingly shown that this so-called R-curve equation correctly predicts K∞, which is comparable to the conventionally measured Mode I plain-strain fracture toughness, KIc, of the same material. The fundamental constants in the fracture-mechanics-based equations are discussed, emphasizing the aspects pertinent to the small specimens used in the MDBT. Results are presented on 8 materials: ZnS, glass-ceramic, Si3N4, Ti5Si3, SiC, Ni3Ge, NiAl and Ti-46.5A1-2.1Cr-3.0Nb-0.2W. All are brittle except for the latter two, which undergo slight plastic deformation before fracturing. The resulting values of K∞ are in excellent agreement with published values derived from conventional measurements, providing considerable confidence in the method. where Q is a constant and K∞ is the crack resistance at ”infinite” crack length. It is convincingly shown that this so-called R-curve equation correctly predicts K∞, which is comparable to the conventionally measured Mode I plain-strain fracture toughness, KIc, of the same material. The fundamental constants in the fracture-mechanics-based equations are discussed, emphasizing the aspects pertinent to the small specimens used in the MDBT. Results are presented on 8 materials: ZnS, glass-ceramic, Si3N4, Ti5Si3, SiC, Ni3Ge, NiAl and Ti-46.5A1-2.1Cr-3.0Nb-0.2W. All are brittle except for the latter two, which undergo slight plastic deformation before fracturing. The resulting values of K∞ are in excellent agreement with published values derived from conventional measurements, providing considerable confidence in the method.
    Type of Medium: Electronic Resource
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