ISSN:
1572-9559
Schlagwort(e):
Near-millimeter wave
;
far-infrared
;
millimeter wave
;
sub-millimeter
;
spectroscopy
;
materials
;
refractive index
;
absorption coefficient
;
dielectric constant
;
loss tangent
Quelle:
Springer Online Journal Archives 1860-2000
Thema:
Physik
Notizen:
Abstract We have used non-dispersive Fourier-transformspectroscopic techniques to measure the complex indices of refraction of materials between frequencies of 120 and 550 GHz. Results are presented for crystal quartz, crosslinked polystyrene (Rexolite 1422), glass-loaded polytetrafluoroethylene (Duroid 5880) and a nickel ferrite (Trans-Tech 2-111). These results are compared with other data on these materials in this frequency range. The accuracy of these measurements yields a considerable improvement in the near-millimeter-wave characterization of several of these materials. For materials other than crystal quartz, our results are the first measurements of their properties over the entire frequency range studied.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1007/BF01014034
