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The transport and switching of Xe atoms on the Ni-W interface of a scanning tunnelling microscope (1993)

Flores, F. ; Cerdá, J. R. ; Andres, P. L. ; [et al.]

Springer

Il nuovo cimento della Società Italiana di Fisica 15 (1993), S. 451-457

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ISSN: 0392-6737

Keywords: Electron microscopy determinations (including scanning tunneling electron microscopy methods) ; Other topics in nonelectronic transport properties ; Geometry ; atomic and molecular orientation ; crystal shapes ; surface topography

Source: Springer Online Journal Archives 1860-2000

Topics: Physics

Notes: Summary The transport and switch of Xe atoms on the Ni-W interface of a scanning tunnelling microscope have been analysed for different geometries as a function of the tip position with respect to the Ni(110) surface. Our results show that the control of the different experimental results can only be achieved by a precise control of the position of the tip on the sample. In particular, the tip-sample Xe switch can only be obtained within tip heights of 0.2Å.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF02456927

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