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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 24 (1993), S. 509-513 
    ISSN: 1059-910X
    Keywords: Convergent-beam diffraction ; Lattice parameter ; Computer simulation ; Electron wavelength ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: We have found significant differences between the results of computer simulations of HOLZ line patterns. The computations in question are made in the kinematical approximation. After trivial errors are eliminated the programs fall into two groups. There is a discrepancy between the two that increases with distance from the zone axis. The difference is small but not negligible at the level of precision used in determining lattice parameters or strain.We show which of the two is correct in the kinematic approximation and that the discrepancy between the two groups is of the order of the error introduced by dynamical interaction. © 1993 Wiley-Liss, Inc.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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