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  • 1
    Electronic Resource
    Electronic Resource
    Hoboken, NJ : Wiley-Blackwell
    AIChE Journal 24 (1978), S. 1000-1010 
    ISSN: 0001-1541
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Notes: Correlations producing thermodynamic property tables employ the concepts of scaling with increasing frequency in the vapor-liquid critical region. One of the important concepts is that the vapor pressure equation should provide infinite curvature and finite slope ψc at the critical point. The vapor pressure critical exponent θ describes the divergent curvature in a power law expression.This paper provides an extensive study of θ. We have determined an optimal value of θ by two general approaches: a curve fit method (CFM) which employs least-squares analyses, and a numerical derivative method (NDM). The CFM is interpolative but requires a vapor pressure equation, while the NDM is extrapolative but is independent of the vapor pressure equation.The vapor pressure equations, which satisfy scaling concepts most closely, exhibit a very flat minima for the CFM. As a result, the values of θ which provide reasonable correlations vary over an appreciable range (depending upon the compound, form of the equation, and the temperature range). The NDM did not present any particular difficulties. Our overall weighted average for θ is 0.199 with a standard deviation of 0.052, while the overall numerical average was 0.225 with a standard deviation of 0.045; the final recommended value of θ is 0.22 ± 0.04.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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