Publication Date:
2019-07-13
Description:
Crop stress measured using thermal infrared emission is evaluated with the stress-degree-day (SDD) concept. Throughout the season, the accumulation of SDD during the reproductive stage of growth is inversely related to yield. This relationship is shown for durum wheat, hard red winter wheat, barley, grain sorghum and soybeans. It is noted that SDD can be used to schedule irrigations for maximizing yields and for applying remotely sensed data to management of water resources. An airborne flight with a thermal-IR scanner was used to examine the variability in temperature that may exist from one field to another and to determine realistic within-field temperature variations. It was found that the airborne and the ground-based data agreed very well and that there was less variability in the fields that were completely covered with crops than those of bare soil.
Keywords:
EARTH RESOURCES AND REMOTE SENSING
Type:
International Symposium on Remote Sensing of Environment; Apr 23, 1980 - Apr 30, 1980; San Jose; Costa Rica
Format:
text
