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Determination of crystallographic polarity of CdTe crystals with Auger electron spectroscopy (1987)

Lu, Y.-C. ; Stahle, C. M. ; Morimoto, J. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 61 (1987), S. 924-927

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The crystallographic polarity of CdTe crystals has been studied with Auger electron spectroscopy. The polarity of various surfaces could be determined by normalizing the low-energy Te (NOO) peak with the high-energy Te (MNN) peak. Upon comparing the normalized ratios from both {111} surfaces, the ratio from (111) Te surfaces was found to be about 1.3 times that from (111) Cd surfaces. The identified polarity was consistent with recent results of anomalous absorption of x rays, the convergent beam method of transmission electron microscopy, and chemical etching. Air-cleaved {110} surfaces of CdTe crystals and surfaces of pure Te crystals were studied for comparison as well.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.338143

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