ALBERT — All Library Books, journals and Electronic Records Telegrafenberg

Hits per page

hit 1 - 1 | 1 hit

Select All Export

Electronic Resource

Treatment of soft threshold in impact ionization (2001)

Tan, C. H. ; David, J. P. R. ; Rees, G. J. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 90 (2001), S. 2538-2543

add to mindlist on the mindlist

Details

ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The avalanche multiplication and excess noise properties of a range of submicron Si diodes have been measured and analyzed using a model for impact ionization which includes the effect of dead space, modified to allow for a gradual onset of ionization, with realistic threshold energies. Good agreement is achieved between the predictions of this "soft dead space" model and measurements of multiplication and excess noise, both on a range of submicron diodes with uniform electric fields and also on a p+n diode with a highly nonuniform electric field. © 2001 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1388865

	Location	Call Number	Expected	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit