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Recombination in nanophase TiO2 films (1994)

Könenkamp, R. ; Henninger, R.

Springer

Applied physics 58 (1994), S. 87-90

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ISSN: 1432-0630

Keywords: 72.40 ; 73.60 ; 81.15

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract Recombination and transport parameters were determined in Schottky diodes made of thin TiO2 solgel films with particle size around 50 nm. Effective recombination times are typically in the range, 10 μs〈τ〈1 ms, depending on injection level. The lifetimes are found to decrease at higher current levels, indicating bimolecular recombination kinetics due to a progressive increase in trap occupation. The mobility-lifetime product is estimated to be ≈5×10−11 cm2/V and is independent of current level.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00331523

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