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Direct error estimation based on the potential drop in TLM diffusion modelling (1998)

Gui, X. ; Haslett, J. W. ; Dew, S. K. ; [et al.]

Chichester [u.a.] : Wiley-Blackwell

International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 11 (1998), S. 255-257

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ISSN: 0894-3370

Keywords: Engineering ; Numerical Methods and Modeling

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Electrical Engineering, Measurement and Control Technology

Notes: We re-examine the potential drop method to give a direct estimation of the absolute error in transmission-line matrix (TLM) diffusion modelling. In particular, the open-circuit boundary is taken into account. Promising results are presented with a structure relevant to thermal analysis of semiconductor devices. © 1998 John Wiley & Sons, Ltd.

Additional Material: 4 Ill.

Type of Medium: Electronic Resource

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