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  • Articles  (7)
  • Photoluminescence  (7)
  • Wiley-Blackwell  (7)
  • MDPI Publishing
  • Electrical Engineering, Measurement and Control Technology  (7)
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  • Articles  (7)
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  • Wiley-Blackwell  (7)
  • MDPI Publishing
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  • Electrical Engineering, Measurement and Control Technology  (7)
  • Physics  (7)
  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 3 (1994), S. 131-136 
    ISSN: 1057-9257
    Keywords: II-VI compound ; SrS : Ce ; Photoluminescence ; Concentration quenching ; Phosphorescence ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: The luminescence efficiency of SrS: Ce powders in the doping range from 0.01 to 1.0 at.% was investigated by photoluminescence decay studies. The radiative decay time of Ce3+ in SrS was determined to be 27 ns. The onset of concentration quenching at concentrations higher than about 0.7 at.% has been obtained. The photoluminescence spectrum of Ce3+ exhibits two emission bands as a consequence of the ground state splitting. The Huang-Rhys factor of the 5d-4f transition was estimated to be about 6. The inhomogeneous broadening of the emission band of samples with higher doping level has been investigated by site-selective and time-resolved spectroscopy.
    Additional Material: 9 Ill.
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 3 (1994), S. 191-198 
    ISSN: 1057-9257
    Keywords: ZnSe ; ZnSSe ; GaAs substrate ; MOVPE ; Photoluminescence ; Quantum well ; Interface properties ; Growth interruption ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: In this work we report on ZnSxSe1 - x/ZnSe quantum wells grown by atmospheric pressure MOVPE on GaAs substrates. Diethylznc (DEZn), diethylselenium (DESe), diethylsulphur (DES) and H2S were used as source materials. Binary quantum wells with ZnSe or ZnS as barrier were usually grown in sets of 10 pairs on a 0.5 μm ZnSe or ZnS buffer, respectively. QWs with different well thicknesses (1-4 nm) show a typical shift to higher energies with decreasing well thickness and also a large decrease in PL intensity with increasing well thickness. Owing to the onset of relaxation above 5 nm well thickness, no PL emission could be observed. QWs of the same thickness but grown at different temperatures (420-520°C) show a broadened line shape with decreasing growth temperature. Growth interruption (3-50 s) also causes a broadening of the PL emission with decreasing interruption time. This is caused by interface reconstruction at higher growth temperatures and longer growth interruption. A ZnS buffer of 0.5 μm improves the PL line shape compared with a ZnSe buffer.ZnSxSe1 - x/ZnSe single and multiple QWs (Lz = 1-4 nm) were grown to reduce the strain in the structures. A typical quantum confinement energy shift of 160 meV for the 1 nm well can be observed in ZnS0.68Se0.32/ZnSe QWs. In comparison with the binary QWs, the FWHM could be reduced by about a factor of two to 34 meV. This improvement was obtained by an optimisation of the switching process to prevent the desorption of sulphur from the ZnSSe during the growth interruption.
    Additional Material: 6 Ill.
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 3 (1994), S. 203-208 
    ISSN: 1057-9257
    Keywords: ZnSe ; Diallylselende ; Plasma ; MOVPE ; Nitrogen doping ; Raman spectroscopy ; Photoluminescence ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: In order to obtain high quality Znse epilayers on GaAs which can be intentionally P- and n-type doped growth at a reduced temperature is highly desirable. Therefore in this work the suitability of diallylselenide and the influrnce of plasma precracking have ben investigated. Photoluminesscence, Raman spectroscopy, scanning electron microscopy, X-ray, SIMS and Hall measurements were used to anaylse the samples. The selenium precursor was fully decomposed at temperatures above 360°C if it was precracked by a plasma. Bound excitions could be resolved with negligible donor-acceptor pair (DAP) and copper green emission in the PL spectra form films which were grown with a plasma at temperatures beyond 530°C. Clearly the hpe for reduction in the deposition temperature was not achieved. Raman spectra also revealed strong crystalline quality variations. For the doping experiments nitrogen was used as the carrier gasa instead of hydrogen. Plasma cracking of the selenium precursor was still necessary. Thye substitution of the H2 carrier gas by nitrogen reduced the growth rate by a factor of 2.6 but enhanced the crystalline properties of the samples as shown by the Raman measurements. Strong DAP emission at 2.7eV in the (PL) spectra was observed. SIMS measurements showed a nitrogend concertration of about 3 × 1017 cm-3. An additional nirtogen plasama (0-7W) had a begligible effect on the nitrogen concentration in the sample. The samples were semi-insulating, whichmight be a conswquence of the crystalline quality of ZnSe grown with DASe as selenium precursor.
    Additional Material: 5 Ill.
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  • 4
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 3 (1994), S. 261-267 
    ISSN: 1057-9257
    Keywords: ZnSe ; ZnSxSe1 - x ; MOVPE ; Photoluminescence ; Mapping ; Purified ; DESe source ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: In this paper we report new results concerning the cause of impurities responsible for the Ix, and I2-peaks in photoluminescence (PL) spectra of ZnSe grown by MOVPE. An improvement in ZnSe epilayer quality is obtained by using a metal organic selenium precursor with reduced chlorine concentration. The PL spectrum of such a layer shows typical excitonic transitions, but compared with samples grown with a more contaminated source, the intensity of the Ix, and the I2 peaks decreases relative to the free exciton transition. A Gaussian fitting of the donor-bound exciton peaks taking the background of other structures into account shows that the ratio between the Ix and I2 peaks does not differ significantly between two samples. Both the decrease in donor-bound exciton transitions and the unchangeability of the ratio Ix/I2lead to the conclusion that only chlorine impurities are responsible for Ixand Ix. In order to verify the homogeneity of impurity uptake across a 2 inch wafer, we performed PL mapping of ZnSxSe1 - x layers. Mapping of a 2 inch ZnSe wafer shows that the FWHM of Ix across a wafer does not vary significantly (1.55 ± 0.21 meV). On mapping a 2 inch ZnS0.3Se0.7 wafer fabricated with H2S as the sulphur source at TD = 480°C, we found a rotational symmetric dstribution of sulphur in the layer. The sulphur content x at the centre is nearly constant. The difference in x between the centre and the boundary of a bad surface region at the edge of the wafer is less than Δx = 0.045. The FWHM of the band edge luminescence follows the same tendency across the wafer. The dependence of homogeneity on the reactor design as well as the uptake of unintentional impurities from the precursor is discussed in detail.
    Additional Material: 6 Ill.
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  • 5
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 3 (1994), S. 283-288 
    ISSN: 1057-9257
    Keywords: Phosphors ; Alkaline ; Earth sulphides ; Photoluminescence ; CaS ; SrS ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Ca1 - xSrxS Solid Solutions at 10 m/o intervals have been prepared by coprecipitation of sulphates from aqueous solution followed by reduction at 1000°C with hydrogen. Phosphorescence emission spectra have been determined for these solid solutions doped with 0.1 m/o cerium and show a blue shift with increasing strontium content from 2.46 to 2.59 eV. Hyperbolic phosphorescent decay curves were observed at both room and liquid nitrogen temperatures across the composition range and have been broken down into three exponential components by graphical and computer-programme-based methods. At room temperature trap depth values of 0.366, 0.316 and 0.282 eV with measured lifetimes of 1.9, 0.26 and 0.07 ms respectively were determined with little dependence on composition. At liquid nitrogen temperature shallower traps were observed at 0.103, 0.086 and 0.076 eV with respective decay times of 5, 0.4 and 0.09 ms having little sensitivity to changes in the host compostion. These traps are related to intrinsic defects, some of which may be surface in character. The blue shift in emission peak energy with the decrease in band gap from CaS to SrS is discussed.
    Additional Material: 3 Ill.
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  • 6
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 3 (1994), S. 11-14 
    ISSN: 1057-9257
    Keywords: Heteroepitaxy ; CdS ; Crystal structure ; Photoluminescence ; Reflection ; Thin films ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: CdS films were prepared by molecular beam epitaxial growth on clean cleaved InP(110) substrates. Films with thicknesses in the 200 nm range were studied by optical techniques: spectroscopic ellipsometry, reflection and photoluminescence. The film thickness and the dielectric function of the films are evaluated from the ellipsometry data. The feature in the imaginary part of the film dielectric function which is induced by the E1 interband transition in CdS is found to be extremely sensitive to the crystal modification. A splitting of this feature occurring at approximately 200 nm indicates a phase transition in the thin films from the cubic to the hexagonal modification. This is confirmed by reflection measurements which show two series of reflection loops for both modifications for film thickness exceeding 200 nm. The energy positions of the free excitons of the hexagonal and cubic modifications are derived. In addition, the band gap for the cubic modification is determined for the first time. The photoluminescence spectra also reveal cubic and hexagonal contribution of donor-acceptor pair recombinations. From the excitonic transitions attempts are made to identify the main impurities in the layers.
    Additional Material: 4 Ill.
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  • 7
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 3 (1994), S. 301-306 
    ISSN: 1057-9257
    Keywords: Calcium sulphide ; Photoluminescence ; Electroluminescence ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Doped CaS powder samples were prepared using two methods: (i) a metathesis reaction of carbonate with H2S at 1200°C; (ii) reaction with Na2Co3/S flux at 1000°C in nitrogen, followed by washing in an alkaline solution, drying and sieving to give 20-30 μm particles.Powders produced from both reactions were strongly photoluminescent and singificant AC electroluminescence (ACEL) was observed when samples produced by the metathesis reactions were copper coated. Samples prepared using the flux technique on pre-copperdoped carbonate also showed ACEL.The EL excitation process in the flux grown material differs from that in samples prepared using H2S; this stems from Cu2S microdeposits on the particle surfaces of the former. The formation of the needle-like deposit results from precipitation of copper from solid solution with decreasing temperature. The EL emission arises from observable point sources rather than the more uniform emission from copper-coated samples.
    Additional Material: 6 Ill.
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