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  • Articles  (17)
  • Data
  • thin films
  • 1990-1994  (17)
  • 1945-1949
  • Physics  (17)
  • Electrical Engineering, Measurement and Control Technology  (10)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 7 (1994), S. 127-130 
    ISSN: 1572-9605
    Keywords: Superconductivity ; thin films ; photoconduction
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract The photoinduced enhancement of superconductivity in RBa2Cu3O x (R=rare earth or yttrium) and Pr y R1−y Ba2Cu3O x was explored through temperature-dependent resistivity, Hall coefficient and mobility, and x-ray diffraction measurements. The increases inT c are enhanced near the metal-insulator transition, although photoinduced changes always exist in oxygendeficient samples. Several explanations, including intergrain Josephson coupling, photoassisted oxygen ordering, and the trapping of photogenerated electrons in oxygen vacancies, are discussed.
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  • 2
    ISSN: 1573-2746
    Keywords: thin films ; high temperature superconductor ; grain boundaries ; microstructure ; transport properties
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The microstructure and transport properties of various 90° grain boundaries in (103) oriented YBa2Cu3O7(YBCO) thin films grown epitaxially in situ by 90° off-axis sputtering are compared. The (103) films grown on (101) LaAlO3 and (101) SrTiO3 substrates have specific sets of 90° grain boundaries in both principal in-plane directions: 90° [010] twist boundaries along the [101] direction, and 90° [010] symmetrical tilt boundaries and 90° [010] basal-plane-faced tilt boundaries along the (301) direction. No weak-link behavior is observed across some of these boundaries by transport critical current density and normalized magnetic field dependence of J c measurements along both those in-plane directions. High-resolution transmission electron microscopy reveals variations in the structure and microfaceting of the 90° boundaries, which may contribute to the absence of weak-link behavior. These results have important implications for understanding the behavior of step-edge Josephson junctions.
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Interface science 1 (1994), S. 371-384 
    ISSN: 1573-2746
    Keywords: interfaces ; multilayers ; thin films ; epitaxy ; transmission electron microscopy
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The interfacial microstructures in CaTiO3/YBa2Cu3O7-x /SrTiO3/LaAlO3/CaRuO3 multilayers grown on (001) LaAlO3 substrates has been characterized using transmission electron microscopy in combination with scanning electron microscopy. The morphology of films grown on both flat surfaces and on stepped surfaces patterned by ion beam milling were interpreted in terms of effects that influence epitaxial orientation relationships, nucleation of Y2O3 particles, and pinhole formation. The general conclusions are that a-axis oriented YBa2Cu3O7-x particles should be avoided in multilayer structures. The particles give rise to cracking and pinhole formation. Local surface roughness, which may be due to ion beam milling or to the growth mechanism of YBCO, induces Y2O3 particle nucleation and pinhole formation. Very steep surface slopes cause the formation of a-axis YBa2CU3O7-x particles. A critical size effect of the Y2O3 particles is suggested.
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 7 (1994), S. 231-233 
    ISSN: 1572-9605
    Keywords: YBa2Cu3O7 ; thin films ; large-area deposition ; semiconductor substrates
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Our technique of reactive thermal co-evaporation has been extended to fabricate large films (up to 4 in.) of YBa2Cu3O7 with high quality. A rotating substrate holder is used to separate the deposition and oxidation processes. This allows free access of the metal vapors. As large substrate wafers we use Al2O3, Si, and GaAs with buffer layers of CeO2, YSZ, and MgO, respectively. On all substrates, the uniformity of thickness and composition was better than 2%. Inductively measuredT c andj c (77 K) were 87.5±0.2 K and 〉1×106 A/cm2, respectively, across the full wafer area. This holds also for GaAs substrates due to a new procedure of capping by Si3N4.
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  • 5
    ISSN: 1572-9605
    Keywords: Photoconductivity ; high-T c superconductors ; thin films ; spectral dependence
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Temperature and spectral dependences of photoinduced changes of resistance were measured in YBa2Cu3O x thin films with oxygen content ranging as 6.35 〈x 〈 6.75. The absolute value of efficiency of initiation of photoinduced changes decreases with increase in oxygen content, but the position of peaks in the spectral dependence does not change with a change ofx. Temperature dependences of efficiency have an anomaly atT∽220 K, which is present in all the samples studied, and correlates with anomalies observed by other experimental techniques. Qualitatively similar temperature and spectral dependences of efficiency for the samples in both the insulating and metallic phases may be considered as an indication that the persistent photoconductivity effect in YBCO on both sides of the metal-insulator transition has a common origin.
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 7 (1994), S. 849-851 
    ISSN: 1572-9605
    Keywords: High-temperature superconductors ; thin films ; critical current ; flux creep
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Flux creep characteristics ofc-axis-oriented Bi2Sr2CaCu2O x thin films grown by the method of electron beam evaporation of stoichiometric target and subsequent annealing have been investigated in the absence of external magnetic field. A decrease of the pinning potential with decreasing temperature is obtained fromI–V curves. This result is explained by the presence of the spatially nonlinear pinning potential.
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 7 (1994), S. 767-771 
    ISSN: 1572-9605
    Keywords: Tl cuprates ; thin films ; ex-situ thin film processing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Anex situ process has been developed to produce thin superconducting Tl2Ba2CaCu2O8 films. The properties of films grown on different substrates using different annealing regimes were studied. Critical temperatures of 103–107 K were measured on films prepared in a broad range of annealing temperatures on SrTiO3, LaAlO3, and Y-ZrO2 substrates. A critical current density,J c, of 2×106 A/cm2 at 77 K was measured on LaAlO3. Film morphology was studied by SEM, AFM, and STM.
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 6 (1993), S. 1-17 
    ISSN: 1572-9605
    Keywords: Superconductors ; thin films ; thin-film processing ; thin-film deposition ; sputtering ; coevaporation ; activated reactive evaporation ; molecular beam epitaxy ; laser ablation ; CVD ; MO-CVD ; PA-CVD ; multilayers ; heterostructures
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract This review of high-T c superconducting thin-film processing focuses on the developments in thin-film deposition technologies since 1987. The common deposition processes are described with reference to their effects on superconductor film performance. A comparative evaluation of the potential of the technologies is also given. The development of multilayers and heterostructures is an important requirement for future device applications and is also described. The latest results of the deposition of novel superconducting materials and deposition on uncommon substrates are discussed. The outlook on some imminent topics of future development in process technologies for high-T c superconducting thin films is discussed.
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 6 (1993), S. 119-160 
    ISSN: 1572-9605
    Keywords: High-T c superconductivity ; microwave devices ; thin films ; surface resistance ; microwave device fabrication
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract High-T c superconductivity has generated a great deal of interest because of the challenges it presents in the fields of material science, condensed matter physics, and electrical engineering, and because of the potential applications which may result from these research efforts. Thin-film passive microwave components may become the first high-temperature superconducting (HTS) devices available for widespread use and commercialization. In this article, we review aspects of material science, physics, and engineering which directly impact high-T c superconducting microwave devices and discuss issues which determine the performance of these devices. Methods of growing HTS thin films on large-area substrates, techniques for fabricating single-level HTS passive microwave components, and the relevant properties of high-T c superconducting films are discussed, with a focus on thin films of the HTS material YBa2Cu3O7−δ. Several known mechanisms for microwave loss in both the superconductor and the dielectric substrate are presented. An overview of the general classes of superconducting passive microwave devices is given, and representative microwave devices which have been recently demonstrated are described in detail. Examples of a select few HTS active microwave components are also presented. Potential microwave applications are illustrated with comparisons to current technology.
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  • 10
    Electronic Resource
    Electronic Resource
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part B: Polymer Physics 31 (1993), S. 319-326 
    ISSN: 0887-6266
    Keywords: thermal expansion ; thin films ; ellipsometer ; glass transition ; refractive index ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: The glass transition (Tg) of thin polystyrene films (ca. 3000 A˚) cast on silicon wafers was determined by a new technique. An ellipsometer was used to determine the refractive index and thickness of the polystyrene films. Tg was determined by measuring the temperature dependence of the refractive index. The change in thickness with temperature was used to calculate the linear and bulk thermal expansion coefficients of the material. A significant shift in Tg, possibly due to strains induced in the cooled films, was observed between heating and cooling for polystyrene films. © 1993 John Wiley & Sons, Inc.
    Additional Material: 8 Ill.
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  • 11
    Electronic Resource
    Electronic Resource
    Springer
    Marine geophysical researches 14 (1992), S. 47-63 
    ISSN: 1573-0581
    Keywords: Side-scan sonar ; interference fringes ; sediment layers ; thin films ; Bering Sea
    Source: Springer Online Journal Archives 1860-2000
    Topics: Geosciences , Physics
    Notes: Abstract GLORIA side-scan sonographs from the Bering Sea Basin show a complex pattern of interference fringes sub-parallel to the ship's track. Surveys along the same trackline made in 1986 and 1987 show nearly identical patterns. It is concluded from this that the interference patterns are caused by features in the shallow subsurface rather than in the water column. The fringes are interpreted as a thin-layer interference effect that occurs when some of the sound reaching the seafloor passes through it and is reflected off a subsurface layer. The backscattered sound interferes (constructively or desctructively) with the reflected sound. Constructive/destructive interference occurs when the difference in the length of the two soundpaths is a whole/half multiple of GLORIA's 25 cm wavelength. Thus as range from the ship increases, sound moves in and out of phase causing bands of greater and lesser intensity on the GLORIA sonograph. Fluctuations (or ‘wiggles’) of the fringes on the GLORIA sonographs relate to changes in layer thickness. In principle, a simple three dimensional image of the subsurface layer may be obtained using GLORIA and bathymetric data from adjacent (parallel) ship's tracks. These patterns have also been identified in images from two other systems; SeaMARC II (12 kHz) long-range sonar, and TOBI (30 kHz) deep-towed sonar. In these, and other cases world-wide, the fringes do not appear with the same persistence as those seen in the Bering Sea.
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  • 12
    Electronic Resource
    Electronic Resource
    Springer
    Acta mechanica Sinica 8 (1992), S. 97-103 
    ISSN: 1614-3116
    Keywords: thin films ; microgravity
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Thin films are interesting for practical as well as for theoretical reasons. As fluid science and materials science in space have been developing rapidly in recent years, investigation into thin films under microgravity conditions grants this classical topic new research ideas and new application possibilities. This paper first gives an overview about the investigation into thin liquid films and its solidification in the past. Then a discussion leads to microgravity in relevance to thin film research; specially, the influence of gravity on the thin film drainage. Some results from our research program are then presented. Finally, the authors tried to point out several possible directions in the research on thin films under microgravity in the near future.
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  • 13
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 5 (1992), S. 107-114 
    ISSN: 1572-9605
    Keywords: High Tc ; thin films ; flux creep
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Critical current density vs. temperature curves and I–V characteristics have been measured onc-axis-oriented BSCCO thin films. The experimental data have been described in terms of flux creep effects. Although the films are not single phase and carry a slightly lower critical current density with respect to those of BSCCO single crystals, the measurements point to the presence of flux thermally activated phenomena with a pinning potentialU 0 of about 25 meV.
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  • 14
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 3 (1990), S. 411-416 
    ISSN: 1572-9605
    Keywords: Bi2Sr2Ca2Cu3O x ; thin films ; sequential deposition
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Thin BSCCO films with the 2223 structure were deposited onto MgO substrate kept at 665°C by applying a sequential sputtering method using metallic Bi and Sr-Ca-Cu-O targets. The resultant films were then cooled under various oxygen partial pressures and cooling rates. It was found that the oxygen partial pressure and substrate temperature during cooling affect significantly the development of superconductivity of the as-deposited films. When the films were cooled stepwise under a critical oxygen partial pressure around 0.3 torr, the as-deposited films showed either superconductivity or nonsuperconductivity behavior. HRTEM images of the films showed no essential difference in the modulated structure, suggesting that the excess oxygen in the Bi-O double layers is the same and not the cause of the different superconducting behavior in the as-deposited films.
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  • 15
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 3 (1990), S. 251-259 
    ISSN: 1572-9605
    Keywords: Resonators ; r.f. measurements ; stripline ; surface resistance ; thin films
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We review methods of measuring surface resistance (R s ) of thin films using stripline resonators, and present our measurements of theR s of YBa2Cu3O7−x films as a function of frequency, temperature, and r.f. magnetic field. The films were deposited on LaAlO3 substrates by two methods: (1) electron-beam coevaporation of Y, BaF, and Cu followed by annealing in O2, and (2) single-targetin situ sputtering. The measurements were obtained at frequencies from 0.4 to 10 GHz, temperatures from 4 to 90 K, and an r.f. magnetic field range from 0 to 30 Oe. At low temperature and low r.f. field at 0.4 GHz, theR s values obtained for the two deposition methods are approximately 7×10−6 and 4×10−6 Ω, respectively.
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  • 16
    Electronic Resource
    Electronic Resource
    Springer
    International journal of thermophysics 11 (1990), S. 293-303 
    ISSN: 1572-9567
    Keywords: ac calorimetry ; composites ; flash method ; multilayer ; photoacoustic method ; thermal diffusivity ; thin films
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract This review discusses the following methods for measuring thermal diffusivity of thin materials: ac calorimetric method, flash method, mirage-effect method, picosecond time-resolved thermoreflectance method, photoacoustic method, etc. The measurements are classified into the following three cases: (a) that yield thermal diffusivity parallel to the surface of a thin material, (b) that yield thermal diffusivity perpendicular to the surface, and (c) that yield thermal diffusivity perpendicular to the surface of a thin material but deposited on a solid substrate. The contribution of inhomogeneity in the spatial distribution of the imparted thermal energy and obscureness at the edge of the restricted region, to which uniform thermal energy is imparted, is considered in each case. The contribution of temporal distortion of the temperature pulse, waves, etc., is considered in each measurement. The proper thickness of samples required for the measurements is discussed. In some of the measurements, the applicable materials are restricted, for instance, thermoreflectance measurements are applicable to metallic samples only.
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  • 17
    Electronic Resource
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    Springer
    International journal of thermophysics 11 (1990), S. 811-817 
    ISSN: 1572-9567
    Keywords: high-speed techniques ; reflectance ; sound velocity ; thermal diffusivity ; thin films
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract An optical transient reflectance technique has been developed to characterize both the thermal and the elastic properties of thin-film materials. The use of picosecond-duration laser pulses permits the study of metal films of the order of 100 nm thick. We demonstrate the measurement of thermal diffusivity and acoustic velocity, in addition to observations of the thermal impedance of a single metal-metal interface.
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