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  • International Union of Crystallography (IUCr)
  • 2000-2004  (4,316)
  • 1965-1969  (2,736)
  • 1960-1964  (1,791)
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Publisher
Years
Year
  • 11
    Electronic Resource
    Electronic Resource
    Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1241-1245 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A synchrotron radiation X-ray powder diffractometer for samples of very small amount has been developed to collect high-quality diffraction patterns under extreme conditions, i.e. at low temperature and/or high pressure. A new cylindrical imaging plate (CIP) is used as a detector, in addition to a conventional flat-type imaging plate (FIP). By using the CIP system, the diffraction data in a diffraction angle range −44 ≤ 2θ ≤ 122° are collected with a dynamic range of about 106. The alignment of the diffractometer, measurement and analysis are automatically operated by a workstation. A performance test shows that the CIP system has spatial resolution of about 0.07° with a dynamic range of 106. The diffraction pattern of a standard sample of Si measured by the CIP system has high quality; the refinement of the structure reaches Rw = 3.68% even in the case of a small amount of sample (about 2 µg) and a short exposure time (60 s). Examples of experiments at low temperatures under ambient and high pressures are also presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800009286
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  • 12
    Electronic Resource
    Electronic Resource
    Powder diffraction beyond the Bragg law: study of palladium nanocrystals (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1262-1270 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An experimental method of measurement of the subtle changes of structure of metal nanocrystals occurring on chemisorption of oxygen, interaction with inert gas and hydrogen, etc., is proposed. The measured patterns and their evolution are interpreted via atomistic simulations. Described are quantitative observations of the changes in peak position, intensity and half width of the 111 diffraction peak of a palladium catalyst caused by modifying the gaseous environment. The results of the measurements are in line with an atomistic model proposed earlier and prove that the measured average lattice constant of palladium clusters evolves according to their surface relaxation. The evolution of the measured peak intensity suggests surface ordering effects and was used to propose a detailed structural model of nanocrystalline metal particles. The transition of palladium into β-Pd-H in hydrogen under normal conditions was used as a structure probe and provided evidence for the presence of icosahedral clusters in a highly dispersed catalyst. The icosahedral phase is not significantly modified under hydrogen atmosphere and does not transform into the β hydride.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800009869
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  • 13
    Electronic Resource
    Electronic Resource
    Microcrystallography with an X-ray waveguide (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1231-1240 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A waveguide microdiffraction setup is described for an undulator beamline at the European Synchrotron Radiation Facility. The composite optics consists of a waveguide, which confines the beam vertically, and a horizontally focusing multilayer mirror. A beam size of about 0.1 × 3 µm (vertical × horizontal) at λ = 0.095 nm has been obtained. The sample stage comprises a three-axis gantry with micrometre precision and a three-axis piezo-scanner with about 0.1 µm repeatability. Diffraction experiments are demonstrated for selected inorganic and polymeric samples. Possibilities for scanning diffractometry and small-angle scattering experiments are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800009249
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  • 14
    Electronic Resource
    Electronic Resource
    An imaging-plate detector for small-angle neutron scattering (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1253-1261 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Small-angle neutron scattering (SANS) measurements have been performed on long-flight-path pinhole-collimation SANS instruments using, as a two-dimensional position-sensitive detector, both a neutron imaging plate, incorporating gadolinium, and a two-step transfer method, with dysprosium foil as the image transfer medium. The measurements are compared with corresponding data taken using conventional position-sensitive gas proportional counters on the SANS instruments in order to assess the viability of the imaging techniques. The imaging plates have pixel sizes of about two orders of magnitude smaller than those of the gas proportional counter. The reduced pixel size provides definite advantages over the gas counter in certain specific situations, namely when limited space necessitates a short sample-to-detector distance, when only small samples (comparable in size to the detector pixels) are available, or when used in conjunction with focusing beam optics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800009067
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  • 15
    Electronic Resource
    Electronic Resource
    Peter Goodman (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1302-1302 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800011420
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  • 16
    Electronic Resource
    Electronic Resource
    Evolution structurale de la nacrite en fonction de la nature des molécules organiques intercalees (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1351-1359 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Nacrite has been intercalated with two polar organic molecules: dimethyl sulfoxide (DMSO) and N-methylacetamide (NMA). The homogeneous nacrite complexes have been studied by X-ray diffraction (XRD) and infrared (IR) spectroscopy. The XRD study is based on a comparison between experimental and calculated patterns. The structures of the intercalated compounds have been determined, including the mutual positions of the layers after intercalation and the positions of the intercalated molecules in the interlayer space. It has been shown that the intercalation process causes not only a swelling of the interlayer space but also a shift in the mutual in-plane positions of the layers. This shift depends on the nature of the intercalated molecules and is related to their shape and the hydrogen bonds which are established with the surrounding surfaces. For a given molecule, the intercalation process is the same for the different polytypes of the kaolinite family. These XRD results are consistent with those of IR spectroscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800011730
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  • 17
    Electronic Resource
    Electronic Resource
    Estimating nanoparticle size from diffraction measurements (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1335-1341 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Nanometre-sized particles are of considerable current interest because of their special size-dependent physical properties. Debye–Scherrer diffraction patterns are often used to characterize samples, as well as to probe the structure of nanoparticles. Unfortunately, the well known `Scherrer formula' is unreliable at estimating particle size, because the assumption of an underlying crystal structure (translational symmetry) is often invalid. A simple approach is presented here which takes the Fourier transform of a Debye–Scherrer diffraction pattern. The method works well on noisy data and when only a narrow range of scattering angles is available.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800010888
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  • 18
    Electronic Resource
    Electronic Resource
    X-ray diffractometer for structural studies of surfaces and interfaces (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1342-1350 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A novel high-precision X-ray diffractometer for structural studies of crystal surfaces and interfaces is presented. In the construction of this instrument, separate detector and sample circles were adopted. This arrangement allows either horizontal or vertical sample geometries to be combined with a variety of sample chambers. The base of the diffractometer is a hexapod with six hydraulic telescopic struts, which confer six degrees of freedom on the platform. This design replaces the conventional stack of translation and rotation stages for aligning the sample with the X-ray beam. An innovative fast control and data acquisition system eliminates the dead time associated with reorienting a conventional diffractometer. With this new system, the time it takes to perform angular scans is limited only by the available counting rate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800011468
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  • 19
    Electronic Resource
    Electronic Resource
    A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1376-1385 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A new method of analysing X-ray peak broadening caused by local tilt distribution in mosaic structures is proposed for double-crystal X-ray diffraction measurements. In the new method, the dependence of whole peak profiles on various reflection indices hkl is analysed, whereas that of only the peak full width at half-maximum (FWHM) is analysed in a conventional broadening analysis. The theoretical formula tells us that not only the FWHM values but also the whole profiles become independent of hkl after rescaling the horizontal axis Δθ of measured patterns to Δθ/cosθc, where θc is the angle between the (001) and (hkl) planes. A new criterion is proposed to judge whether X-ray peak broadening is caused by the local tilt distribution or not; the advantage provided by the new criterion, using whole peak profiles, is high accuracy in making this judgment. It is experimentally verified that the hkl independence holds in terms of whole peak profiles. The advantage of the method is demonstrated experimentally by applying it to InAsP/InGaAsP strained layer superlattice samples.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800012772
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  • 20
    Electronic Resource
    Electronic Resource
    A small-angle neutron scattering model for polydisperse spherical particles with diffusion zones and application to soft magnetic metallic glass (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1386-1392 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An analytical expression for the small-angle neutron scattering intensity of diluted systems of polydisperse spherical particles, with diffusion zones, embedded in a matrix is presented. It is used within a nonlinear regression procedure to analyse small-angle neutron scattering experiments with polarized neutrons on an Fe73.5Si15.5B7CuNb3 alloy. The results for the nuclear and magnetic scattering length densities allow verification of the inhibitor concept introduced for the explanation of the limited sizes of precipitates developing during nanocrystallization. In the case of amorphous Fe73.5Si15.5B7CuNb3 alloy, the observed nanocrystals of the Fe3Si type are surrounded by an Nb-enriched shell, which stops the growth of the precipitates. With the results of polarized neutron scattering experiments, it is shown that magnetic and nuclear small-angle neutron scattering signals have the same origin. Additionally, the precision of the fits is improved by complementary use of polarized neutrons.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800013248
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