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  • 1
    Electronic Resource
    Electronic Resource
    A task-switching system for digital signal processor-based scanning probe microscopes (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 318-319 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A simple software framework to manage the concurrent execution of small, programmable, tasks is described. The system is intended for use with a digital signal processor-based scanning probe microscope and is written in ANSI C. The design provides independent memory management, message passing, and structured programming of tasks. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150200
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  • 2
    Electronic Resource
    Electronic Resource
    Calculations of the dynamic Debye–Scherrer diffraction patterns for small metal particles (1995)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 103 (1995), S. 2384-2394 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Dynamic diffraction pattern profiles are calculated for randomly oriented aggregates of gold and silver in the size range from 147 to 5083 atoms and at incident electron energies of 40 kV and 100 kV. The Debye–Scherrer diffraction patterns were obtained by combining a series of multislice calculations performed on model particles over a range of orientations. Calculations are performed for both fcc and icosahedral structures. The results show that corrections to the kinematical theory (Debye equation) are more important than predicted by the two-beam theory of Blackman. One calculation, a fcc 923-atom silver aggregate at 100 kV, showed a distortion to the (111) Bragg peak causing it to to shift its center to a higher scattering angle. Scattering corrections to the icosahedral results are less important than for an equivalent sized fcc aggregate and preserve the general diffraction features seen in kinematic calculations. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.469662
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  • 3
    Electronic Resource
    Electronic Resource
    Optimum event rate for a CCD detector (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2668-2671 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A simple event-counting technique is considered that can be implemented on detector systems with adjustable exposure times. A single measurement cycle has two steps: exposure and readout. During readout a threshold is used to discriminate against background noise, making it impossible to differentiate between single or multiple events. The actual event rate can be estimated by accumulating the results of repeated measurement cycles, and applying a correction based on the probability for multiple events to occur. By considering the uncertainty in the estimation of the event rate, and assuming a Poisson process, it is shown that optimum exposure requires an average event count per exposure of roughly 1.7. The technique is applied to a high-energy electron-counting system based on a linear CCD photodetector. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145607
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  • 4
    Electronic Resource
    Electronic Resource
    An electron diffraction apparatus for studies on small particles in a molecular beam (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 1481-1488 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An electron diffraction apparatus is described that has been designed specifically for use with molecular beams containing small particles in the nanometer size range. A novel electron detection system has been developed, using linear charge coupled device imagers, which allows rapid parallel measurement of the diffraction signal in a direct electron counting mode. The apparatus also features a 100 kV electron gun and electron optics derived from a Philips EM 300 electron microscope. Details of the apparatus are presented and measurement results on small silver particles in a beam of helium carrier gas are also given; these are interpreted using an icosahedral structure for the small particles.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142472
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  • 5
    Electronic Resource
    Electronic Resource
    The choice of optimum exposure time for a simple electron counting system (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 2486-2488 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The question of an optimum exposure time for an event counting charge coupled device electron detection system is discussed [B. D. Hall, M. Flüeli, J. -P. Borel, and R. Monot, Rev. Sci. Instrum. (in press)]. The system is a null-event detector, providing a single piece of information per exposure: whether an event has not been detected. It is shown that when the number of exposure periods is fixed, optimum operation conditions require high exposures, in spite of the loss of information due to multiple events being detected as single ones.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142270
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  • 6
    Electronic Resource
    Electronic Resource
    Debye function analysis of structure in diffraction from nanometer-sized particles (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 1666-1675 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The special features of diffraction from particles in the nanometer size range are discussed and the problem of structure determination is considered. A direct method of structure analysis, known as Debye Function Analysis, is presented and evaluated. The method is capable of obtaining information about both the size and structure of domains in a sample, and can identify noncrystalline structures. Numerical simulations of observations are used to investigate the limitations of the technique, and also provide a general method for quantifying uncertainties in parameters estimated by Debye Function Analysis. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372075
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  • 7
    Electronic Resource
    Electronic Resource
    CONFIGURATIONAL STUDIES OF POLYNUCLEOTIDES AND RIBONUCLEIC ACID (1959)
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 81 (1959), S. 0 
    Details
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1749-6632.1959.tb49351.x
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  • 8
    Electronic Resource
    Electronic Resource
    Introduction to crystallography: two-dimensional computer simulations (1998)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 31 (1998), S. 477-480 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Many elementary concepts of crystallography can be presented in two dimensions, where they are relatively easy to visualize. A computer simulation program for two-dimensional crystallography has been developed for use in teaching at an introductory level. The program will generate and display direct and reciprocal lattices, based on arbitrary user input, and is able to apply the symmetry operations of any of the 17 two-dimensional plane groups to a user-defined motif. Examples using the program are presented and discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889897010546
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  • 9
    Electronic Resource
    Electronic Resource
    Estimating nanoparticle size from diffraction measurements (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1335-1341 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Nanometre-sized particles are of considerable current interest because of their special size-dependent physical properties. Debye–Scherrer diffraction patterns are often used to characterize samples, as well as to probe the structure of nanoparticles. Unfortunately, the well known `Scherrer formula' is unreliable at estimating particle size, because the assumption of an underlying crystal structure (translational symmetry) is often invalid. A simple approach is presented here which takes the Fourier transform of a Debye–Scherrer diffraction pattern. The method works well on noisy data and when only a narrow range of scattering angles is available.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800010888
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  • 10
    Electronic Resource
    Electronic Resource
    Decrease in the growth rates of atmospheric chlorofluorocarbons 11 and 12 (1993)
    [s.l.] : Nature Publishing Group
    Nature 364 (1993), S. 780-783 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] We report here the recent change in growth rates of troposph-eric CFC-11 and -12, based on 15 years of data from flask samples and in situ instruments located at the monitoring stations of the National Oceanic and Atmospheric Administration's (NOAA) Climate Monitoring and Diagnostics Laboratory ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/364780a0
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