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  • American Association for the Advancement of Science (AAAS)  (2,612)
  • American Association of Petroleum Geologists (AAPG)
  • International Union of Crystallography (IUCr)
  • 1990-1994  (3,935)
  • 1985-1989
  • 1992  (3,935)
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  • 1990-1994  (3,935)
  • 1985-1989
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  • 1
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 1-5 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Based on investigations at 9 and 295 K, Na2UI6 has been shown to crystallize in a new structure type corresponding to space group R{\bar 3}, in contrast to ionic conductors of the type Na2UX6 for X = Cl, Br which crystallize in the space group P{\bar 3}ml. Atomic positions of sodium and iodine have been refined using the Rietveld profile fitting procedure. It was found that in space group R{\bar 3} the U, Na and I atoms occupy positions 3(a), 6(c) and 18(f), respectively. The relation between the Na2UCl6-type structure and the structure of Na2UI6 is discussed.
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  • 2
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 11-15 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An in situ observation of the structure transition of GeO2 has been made under 3.0 GPa at various temperatures with a diamond-anvil pressure cell. The time-resolved energy-dispersive (ED) diffraction experiment was undertaken using synchrotron X-radiation. A profile analysis of ED spectra observed every 15 min elucidates the transition process from the α-quartz form (P3221, Z = 3) to the rutile form (P42/mmm, Z = 2). The time-resolved measurement of their diffraction intensity ratio reveals the change of the mass fraction of the transformed product with time, which provides the transition rate. A transition curve showed three stages at low temperature; firstly a long inductance period after initiation of heat supply, secondly a rapid initiation of transition and finally a marked deceleration of growth. At high temperatures the inductance period of the transition was not observable. The transition is extremely sluggish. An apparent activation energy was calculated by the Avrami–Erofeev equation for the solid-solid transition and found to be 57.4 kJ mol−1.
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  • 3
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 6-10 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Nonlinear equations are given for determining the crystallographic orientation of surfaces of single crystals. The equations are solved by an iterative method in several variables. The angle φ between the surface plane and the lattice plane in question is decomposed into two components α and β. These two components are obtained from the solution of a nonlinear system of equations using two measurements and the Bragg angle. The diffractometric system considered is the well known θ/2θ with a sufficiently large area of X-ray detection and the capability of holding single-crystal samples. The results obtained are discussed from experimental and theoretical points of view.
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  • 4
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 26-30 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A method to improve the scaling of multiple intensity data sets is presented. A general scaling function K(x, s), which uses the direction cosine of the diffraction vector (x) and (sin θ)/λ (s) as scaling parameters, is developed by combining an isotropic scaling function, K(s) = A exp (Bs2), and a multiple s-shell anisotropic scaling function, K(x)s = (Σ Σ cijxij)s. This combined scaling function can greatly reduce the systematic differences in intensities among multiple data sets measured independently. This scaling method for the multiple data sets consists of three steps. In the first step, the individual isotropic scaling functions, K(s), are determined by an indirect least-squares method. Then the weighted mean intensity, 〈I〉, is calculated by applying the K(s) to the individual data sets. In the second step, the data in each data set are divided equally into 20 thin shells of (sin θ)/λ (s). The anisotropic scaling functions, K(x)s, of each s shell are determined by using the weighted mean intensity, 〈I〉, obtained in the first step as the target quantity in a least-squares minimization, i.e. Σ wi{〈I〉i − K(x)s[K(s)Ii]}2. In the final step, the new weighted mean intensity, 〈I〉, is calculated by applying the combined scaling function, K(x, s) = K(s)K(x)s, to the individual data sets. The new multiple s-shell anisotropic scaling functions are determined using the new weighted mean intensity, 〈I〉, as the target quantity in another least-squares minimization. By repeating this procedure three to five times, the least-squares minimization will converge. The method was successfully used to scale and merge 27 sets of S-adenosylmethionine synthetase data into a single data set. It was also used to scale the isomorphous replacement data sets of the enzyme.
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  • 5
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 16-25 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: This work presents a new method of synthesizing the reflection profile, based on the calculation of Fourier coefficients of instrumental functions. The classification and construction of Fourier coefficients are effected, in a general way, from the analysis of the possible paths of beams in the diffractometer. Relationships were obtained which made it possible to synthesize the line profiles in different experimental conditions. The possibility of calculating the reflection profiles of a standard (annealed BaF2) without introducing varying profile parameters is shown. Better results in describing the reflection profiles have been obtained than by applying the Pearson VII function with varying profile parameters.
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  • 6
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 31-38 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A model of size distribution and structural disorder for palladium grown on pumice is developed. The model parameters are determined by fitting the simulated powder pattern to the experimental data. Three samples, characterized by 2.4, 1.14 and 0.86 wt.% Pd respectively were examined. The results point to nearly spheroidal crystallites, with sizes ranging from 40 to 20 Å, affected by stacking faults in the sequence of the close-packed (111) layers to an extent independent of size and by intralayer second-kind distortions. A comparison with the results obtained following classical procedures is supplied. In the Appendix a new approach for the determination of growth stacking faults from peak shifts is presented.
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  • 7
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 39-45 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Approximate analytic expressions for determining the transmission of neutron benders which take into account reflectivity losses using the mean number of reflections agree well with computer simulation results which track the neutron trajectories directly, provided that the reflectivity is high. The exact calculation which can be performed using exponential integral functions for any value of the reflectivity is presented. Ray-tracing techniques for determining the transmission and number of reflections for non-perfect reflectivity can therefore be replaced by direct calculation.
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  • 8
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 46-51 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The simulation of the experimental symmetric X-ray rocking curve of a coherent heteroepitactic structure, using first-order expressions in the incidence parameter, is shown to give a strain-depth profile not consistent with asymmetric rocking curves taken on the same sample. Two different expressions are suggested for the incidence parameter to attain internal consistency among all the rocking curves. The former involves second-order approximations and considers both normal and parallel lattice mismatches. The latter is the result of an exact derivation and takes into account only the normal mismatch. These models make the data from rocking-curve simulation reliable, provided that the angle between the surface and the planes corresponding to the nominal crystallographic orientation is not ignored.
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  • 9
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 65-68 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A procedure for evaluating peaks in the difference Patterson maps calculated from a complete native data set and partial (incomplete) potential isomorphous heavy-atom-derivative data sets is described. A sampling function is defined such that it is unity where data are available and zero elsewhere. It is the Patterson of this sampling function whose characteristics are useful. This function will not reconstruct unavailable information, but can reveal the presence of distorted and/or `false' peaks introduced by the sampling technique used in collecting partial data. This procedure is useful in screening potential heavy-atom derivatives using a minimum number of crystals.
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  • 10
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 52-64 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The theory of surface differential diffraction (SDD) is extended to the case of polarized neutron diffraction. Nuclear and magnetic surface contributions are thus separated. A method for coherent description of the geometry of the grains is proposed. A saturated D layer chemisorbed on Ni carried by silica is studied with the following results: (111) faces represent the majority of the surface; D atoms sit above the centers of surface Ni triangles with no Ni atom in the underlying layer, the Ni–D distance is equal to 0.215 (7) nm; the magnetic moment modification induced by chemisorption is mainly localized in the surface layer of nickel. Two possible interpretations of the magnetic structure factor are discussed: one assumes no magnetic moment on D atoms but Ni displacements; the other is based on opposite assumptions.
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  • 11
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 69-72 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A method and algorithm are described for solution of the autoindexing problem of multiphase polycrystals. A Fortran program, called MRIAAU, which implements the algorithm, runs on a PC and can solve the problem in some minutes (IBM PC with 80286 and higher).
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  • 12
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 69-69 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: In the paper by Schwarzenbach & Flack [J. Appl. Cryst. (1989). 22, 601–605], the equation describing the transformation properties of the crystal-based azimuthal angle ψ is incorrect. The correct formula is derived.
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  • 13
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 87-87 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
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  • 14
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 73-80 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: BLAF represents an original computer program to devise the Bravais lattice symmetry or possible pseudo-symmetries (with allowance for large axial and angular distortions) of an experimental unit cell. The matrix approach to symmetry formulated by Himes & Mighell [Acta Cryst. (1987). A43, 375–384] is further developed and employed to analyse admittable mappings of a lattice onto itself. Solutions of the matrix equations G = MtGM, where G is the metric tensor of the Buerger reduced lattice, are integral matrices M with det(M) = + 1 and −1 〈 tr(M) ≤ 3, composing the seven axial hemihedral point groups 432, 622, 422, 32, 222, 2, 1. For non-triclinic symmetries these matrices carry information about important symmetry directions in the lattice, subsequently used in building up an overall transformation matrix to find a conventional (symmetry-conditioned) unit cell. The average of the generated G tensors in accordance with the particular point-group rules is a tensor Gav bearing information about the symmetry-constrained lattice parameters. Gruber's [Acta Cryst. (1989), A45, 123–131] algorithms have been used to evaluate both Buerger cells and the Niggli cell of a triclinic lattice. BLAF is realised as a separate module suitable for incorporation in the commonly used crystallographic program packages and in the form of two subroutines: enBLAF – to tackle the lattice symmetry problem by automated single-crystal diffractometers; and rBLAF – to be used for lattice symmetry analysis in, for example, programs for autoindexing of powder data. Applications of the three modules are demonstrated in several test examples.
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  • 15
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 81-86 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Normal and half-normal probability plots have been used extensively in the analysis of data and parameters in small-molecule crystallography. A procedure and computer program is described to apply this method to macromolecular data. The utility of this procedure is that a subset of data from a putative heavy-atom derivative can be analyzed and compared with a native set of data providing a quantitative indicator of individual and overall changes in intensity. A qualitative measure of the scattering contribution as a function of resolution can be obtained from comparisons of different resolution ranges. The results from comparisons of (i) native data collected by different techniques and (ii) native and heavy-atom-derivative data suggest a set of guidelines which can be used as an aid in the selection of data with a significant heavy-atom contribution.
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  • 16
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 92-96 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An indexing method for single-crystal diffractometry is described which is applicable to especially difficult cases such as twin lattices, incommensurate structures, fragmented crystals, long axes and unreliable data. Finding the reciprocal lattice from a cloud of reciprocal-lattice points (reflections) is reduced to finding elementary periods in one-dimensional rows, obtained by projecting all observed points onto the normal to the plane formed by any three of these points. Row periodicity and offending reflections are easily recognized. Each row, by its direction and (reciprocal) spacing, defines one direct axis vector, based upon all cooperating observations. From the direct vectors so obtained a primitive direct cell is chosen and refined against the fitting reflections. The result is one main lattice, or a main lattice and a set of alien reflections. The method operates semi-automatically in the program DIRAX and has been tested, without failure, on hundreds of CAD4 reflection files, among which there were many auto-indexing-resistant lists.
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  • 17
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 88-91 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A study of X-ray diffraction in single silicon and quartz crystals in a strong ultrasonic field has been carried out. The dependence of diffraction intensity I(w) on sound amplitude w has been obtained right up to the kinematical limit Ik = I(∞). It is shown that the ratio η = I(∞)/I(0) depends on the crystal quality. Experimental data for different reflections, sound frequencies and X-ray wavelengths are compared with the model calculations for several lattice-distortion mechanisms.
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  • 18
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    Applied crystallography online 25 (1992), S. 97-104 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A new procedure of pattern decomposition in energy-dispersive powder diffraction is presented. The total observed pattern is taken as a sum of incoherent and coherent scattering. The incoherent part is calculated from theoretical cross sections for individual atoms, the coherent part is described as a sum of discrete Bragg peaks and acoustic and optic phonon thermal diffuse scattering (TDS) is calculated from the Debye and Einstein models, respectively. The total TDS is scaled to be the scattering missing from the Bragg reflections due to thermal motion. The model pattern is convoluted by the instrument function calculated from the diffraction geometry, and the pattern is fitted to the observed one by varying the integrated Bragg intensities and thermal motion parameters. The method is applied to patterns of Mg, Al and Ti powders, leading to an unambiguous and self-consistent division to the background and the pattern of Bragg reflections. As an application, the flux of continuous radiation from a W-anode X-ray tube is determined using theoretical integrated Bragg intensities.
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  • 19
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 109-121 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A convolution approach to X-ray powder line-profile fitting is developed in which the line shape is synthesized from the Cu Kα emission profile, the dimensions of the diffractometer and the physical variables of the specimen. In addition to the integrated intensities and 2θ positions of the line profiles, the parameters that may be fitted include the receiving-slit width, the receiving-slit length, the X-ray-source size, the angle of divergence of the incident beam, the X-ray attenuation coefficient of the specimen and the crystallite size. This is a self-consistent approach to fitting as the instrumental parameters are usually known by direct measurement. To minimize correlation between refined instrumental parameters, profiles at high and low 2θ values should be fitted simultaneously. The Cu Kα emission profile used in this work is based on recent monolithic double-crystal spectrometer measurements that have identified a doublet structure in both the Kα1 and Kα2 components. Fast and accurate convolution procedures have been developed and a mixture of multilinear regression and Gauss–Newton non-linear least squares with numerical differentials is used for fitting the profiles. The method is evaluated by fitting powder diffraction data from well crystallized specimens of MgO and Y3Al5O12 (YAG). Testing has also been carried out by examining the changes in the fitted values after altering various instrumental parameters (e.g. receiving-slit width, detector defocus, receiving-slit length and inclusion of a monochromator).
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  • 20
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    Applied crystallography online 25 (1992), S. 122-128 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Microplanar defects were observed in β-iron disilicide by transmission electron microscopy. They were identified as (100)[011]/2 intrinsic stacking faults by means of electron diffraction patterns and observed in high-resolution lattice images. A structural model of the faults is proposed here in setting the defect position at x = ¼ within the cell.
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  • 21
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    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 105-108 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An intrinsic Ge detector is used to analyze the energy spectrum of a well collimated X-ray beam of white radiation diffracted from powder samples of Al, Mg and Ti. Two spectra on each sample are measured at scattering angles where reflections hkl and 2h′ 2k′ 2l occur at the same energies. The Bragg reflections are separated by fitting a model for the different components of scattering to the total spectrum. The thermal-motion parameter B is determined from the intensity ratio of several pairs of reflections. Most of the uncertainties due to a non-ideal sample or errors in the experimental parameters cancel out in the expression for B. The values of B are 0.86 (2) Å2 for Al, Ba = 1.29 (8) Å2 and Bc = 1.60 (9) Å2 for Mg and Ba = 0.63 (4) Å2 and Bc = 0.73 (7) Å2 for Ti, where Ba is for directions perpendicular to the c axis and Bc for the direction of the c axis. The results are in agreement with published values of the thermal-motion parameters.
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  • 22
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    Applied crystallography online 25 (1992), S. 129-145 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An approach for analysing neutron and X-ray specular reflectivity data from stratified media having variation in the scattering-length density near the surface is described. The method has its origin in small-angle scattering and it is composed of two steps: (i) indirect Fourier transformation [Glatter (1977). J. Appl. Cryst. 10, 415–421] giving the profile correlation function p(z) of the derivative dρ/dz of the scattering-length density; (ii) square-root deconvolution [Glatter (1981). J. Appl. Cryst. 14, 101–108] giving dρ/dz and ρ, the scattering-length-density profile. The only requirement for applying the method is that the scattering-length density varies only in a limited range. In nearly all cases the approach does not require any knowledge of the chemical composition of the surface layer and consequently incorporates a certain degree of objectivity. The method gives the smoothest profile which agrees with the experimental reflectivity data. The method is tested on simulated reflectivity data for a series of different surface profiles and subsequently used for analysing experimental data on fluorocarbon amphiphiles in water and salt solutions. The tests on simulated data show that the indirect Fourier transformation gives correlation functions agreeing very well with the corresponding functions of the original profiles. It is further demonstrated that the square-root deconvolution gives reliable results for the scattering-length-density profiles.
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  • 23
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    Applied crystallography online 25 (1992), S. 146-154 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Area detectors have revolutionized data collection in protein crystallography, but unsubstantiated opinion as to the merits of these detectors has sometimes interfered with objective comparisons of area detector quality. Area detectors from four manufacturers were evaluated by collecting data sets on two different protein crystals, carboxypeptidase A and recombinant sperm whale myoglobin. These data sets were first compared by studying their internal consistency using Rsym measurements and as expected these Rsym values were excellent. Next, the data were studied by merging with diffractometer data sets and with each other. Finally, the myoglobin data were used to calculate anomalous difference Pattersons. Area detectors studied in this way included the Mark II from San Diego Multiwire Systems, the FAST from Enraf–Nonius, Inc., the R-AXIS II from Rigaku Corporation and the X-1000A from Siemens Analytical X-ray Instruments, Inc. Wide variations existed in the data-collection parameters chosen by the manufacturers, but all four detectors produced acceptable data as evidenced by mutual agreement and clear interpretability of anomalous difference Patterson maps based on the Fe atom in myoglobin.
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  • 24
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    Applied crystallography online 25 (1992), S. 192-194 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The single-crystal X-ray diffractometer installed at the PWA Laboratory in Frascati is described. The Huber four-circle goniometer is controlled by an IBM-compatible personal computer by means of a plug-in board interface based on the LSI chip Am9513. The program CS running under MS-DOS performs a wide variety of operations from random search to data collection. The angular resolution of the diffractometer is 0.0025°, while the instrumental resolution at 8 keV, with an Si(lll) monochromator, is 0.0026°. After preliminary tests, 2Zn insulin crystals were mounted on the diffractometer and reflections were measured using synchrotron radiation. The rocking curves show full widths at half-maxima (FWHM) in the range 0.013–0.031° mainly due to the mosaicity.
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  • 25
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    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A new polarized target for neutron scattering has been designed by CERN and tested successfully using the reactor FRG-1 at the GKSS Research Centre. The nuclear spins are aligned with respect to the external field – parallel or antiparallel – by dynamic nuclear polarization (DNP). To avoid absorption of neutrons by 3He, the frozen solutions of biomolecules are immersed in liquid 4He which in turn is thermally coupled to the cooling mixture of 3He/4He of the dilution refrigerator. Compared with earlier experiments where the sample had been cooled directly by 3He, the rate of detectable neutrons increased by a factor of 30. Another factor of 30 is due to the installation of the cold source and the beryllium reflector in FRG-1. Polarized neutron scattering from apoferritin in deuterated solvent shows that the proton spin polarization is homogeneous in apoferritin molecules. After saturation of proton nuclear magnetic resonance (NMR), polarized neutron scattering is dominated by deuteron spin contrast. With the deuterated large subunit of E. coli ribosomes, three different basic scattering functions are derived from spin-contrast variation, reflecting the known scattering-length-density distribution of the architecture of rRNA and ribosomal proteins. The planned in situ structure determination of a mRNA fragment is discussed in the light of the present results.
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  • 26
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    Applied crystallography online 25 (1992), S. 181-191 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Low-resolution three-parameter models of the shape of a biopolymer in solution can be determined by a new indirect method from small-angle X-ray scattering without contrast-variation experiments. The basic low-resolution model employed is a triaxial ellipsoid – the inertia-equivalent ellipsoid (IEE). The IEE is related to the tensor of inertia of a body and the eigenvalues and eigenvectors of this tensor can be calculated directly from the atomic coordinates and from the homogeneous solvent-excluded body of a molecule. The IEE defines a mean molecular surface (like the sea level on earth) which models the molecular shape adequately if the IEE volume is not more than 30% larger than the dry volume of the molecule. Approximately 10 to 15% of the solvent-excluded volume is outside the ellipsoid; the radii of gyration of the IEE and of the homogeneous molecular body are identical. The largest diameter of the IEE is about 5 to 15% (0̃.2–0.8 nm) smaller than the maximum dimension of globular molecules with molecular masses smaller than 65000 daltons. From the scattering curve of a molecule in solution the IEE can be determined by a calibration procedure. 29 proteins of known crystal structure have been used as a random sample. Systematic differences between the axes of the IEE, calculated directly from the structure, and the axes of the scattering-equivalent ellipsoids of revolution, estimated from the scattering curve of the molecule in solution, are used to derive correction factors for the axial dimensions. Distortions of model dimensions of 20 to 40% (up to 1 nm), caused by misinterpretation of scattering contributions from electron density fluctuations within the molecule, are reduced to a quarter by applying these correction factors to the axes of the scattering-equivalent ellipsoids of revolution. In a computer experiment the axes of the inertia-equivalent ellipsoids have been determined for a further nine proteins with the same accuracy. The automated estimation of the IEE from the scattering curve of a molecule in solution is realized by the Fortran77 program AUTOIEE.
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  • 27
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    Applied crystallography online 25 (1992), S. 195-198 
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    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The application of the Laue method is extended to phase identification of single crystals. This extension is made possible by a new method of indexing Laue patterns, which is based on computerized rotation of the reciprocal axes of the crystal and a new criterion for judging true solutions. The new method and criterion have been tested successfully for crystals with various structures, including triclinic. An example is given for the phase identification of molybdenum oxide which has six structural modifications.
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  • 28
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    Applied crystallography online 25 (1992), S. 199-204 
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    Notes: High-resolution transmission electron microscopy (HRTEM) and electron diffraction were used to investigate the microstructure of natural lead oxides found in Panzhihua Mountain, China. The electron diffraction patterns showed crossing of diffraction spots along 〈110〉 directions in litharge and along 〈100〉 directions in massicot and the structural images showed the domain-like texture, probably constructed by arrays of planar defects in the fundamental structures. Based upon the structure of these oxides the possible structural models of planar defects are discussed and the orientation relationship of litharge and massicot is determined.
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  • 29
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    Applied crystallography online 25 (1992), S. 211-213 
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    Notes: The lens equation for Bragg diffraction of monochromatic X-rays and neutrons in the case of a cylindrically curved crystal is derived for the general Bragg- and Laue-case geometries. The resulting equation is identical to the formula for polychromatic focusing only in the limits of symmetrical reflection and/or in Rowland geometry.
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  • 30
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    Applied crystallography online 25 (1992), S. 166-180 
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    Notes: Structure determination of macromolecules often depends on phase improvement and phase extension by use of real-space averaging of electron density related by noncrystallographic symmetry. Although techniques for such procedures have been described previously [Bricogne (1976). Acta Cryst. A32, 832–847; Johnson (1978). Acta Cryst. B34, 576–577], modern computer architecture and experience with these methods have suggested changes and improvements. Two unit cells are considered: (1) the p-cell corresponding to the actual crystal structure(s) being determined (there would be more than one of these if the molecule crystallizes in more than one crystal form) and (2) the h-cell corresponding to the molecule in a standard orientation with respect to which the molecular symmetry axes are defined. Averaging can proceed entirely within the p-cell, referring to the h-cell only in as far as knowledge of the molecular symmetry is required. It is also possible to place the averaged molecule back into the h-cell, where it can be used to redefine the molecular envelope or for displaying a suitably chosen asymmetric unit of the molecule. Techniques are discussed for automatically selecting a molecular envelope which is consistent with packing considerations within the p-cell and which retains the symmetry of the molecular point group. The electron density map to be averaged is divided into bricks for storage in virtual memory. Roughly as many bricks as there are noncrystallographic asymmetric units per crystallographic asymmetric unit need to be retained in memory at one time. This procedure minimizes paging problems and avoids double sorting. Use of eight-point interpolation permits storing the map at grid points separated by no more than 1/2.5 of the resolution limit to obtain rapid convergence.
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  • 31
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    Applied crystallography online 25 (1992), S. 214-220 
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    Notes: Software has been written in Fortran77 for the space-filling representation of crystal structures. It generates atomic positions starting from the asymmetric unit and taking into account the 230 possible space groups. It then computes realistic shaded images in correct perspective with the hidden part removed. The main differences from existing programs are the ability to represent thermal ellipsoids and good portability to commonly used workstations. Details are given about the organization and operation of the program and some applications.
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  • 32
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    Applied crystallography online 25 (1992), S. 205-210 
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    Notes: Ambiguities in amino acid sequences are a potential problem in X-ray crystallographic studies of proteins. Amino acid side chains often cannot be reliably identified from the electron density. Many protein crystal structures that are now being solved are simple variants of a known wild-type structure. Thus, cloning artifacts or other untoward events can readily lead to cases in which the proposed sequence is not correct. An example is presented showing that mass spectrometry provides an excellent tool for analyzing suspected errors. The X-ray crystal structure of an insertion mutant of Staphylococcal nuclease has been solved to 1.67 Å resolution and refined to a crystallographic R value of 0.170 [Keefe & Lattman (1992). In preparation]. A single residue has been inserted in the C-terminal α helix. The inserted amino acid was believed to be an alanine residue, but the final electron density maps strongly indicated that a glycine had been inserted instead. To confirm the observations from the X-ray data, matrix-assisted laser desorption mass spectrometry was employed to verify the glycine insertion. This mass spectrometric technique has sufficient mass accuracy to detect the methyl group that distinguishes glycine from alanine and can be extended to the more common situation in which crystallographic measurements suggest a problem with the sequence, but cannot pinpoint its location or nature.
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  • 33
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    Applied crystallography online 25 (1992), S. 221-230 
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    Notes: A generalized formalism on multiple small-angle scattering is proposed to investigate the nature of the extractable structural information on inhomogeneities from the multiple-scattering profile. It is found that the statistical nature of the medium can broaden as well as narrow the scattering profile depending upon the characteristics of the medium. The nature and the extent of the effect of the various approximations on analysing the multiple-scattering data are discussed.
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  • 34
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    Applied crystallography online 25 (1992), S. 237-243 
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    Notes: Even the best least-squares algorithm to extract intensities from a powder diagram will not be able to determine the separate intensities of completely overlapping peaks. In this paper a new method (DOREES) is presented to determine these intensities more accurately by applying relations between structure factors derived from direct methods and the Patterson function. The intensities obtained from the least-squares fit are used as a starting set for DOREES. Comparative tests on both artificially generated and real data show that DOREES improves the intensity set considerably.
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    Applied crystallography online 25 (1992), S. 244-250 
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    Notes: A design is presented of apparatus suitable for energy-dispersive diffuse X-ray scattering in which the sample is oriented on a three-circle cradle within a vacuum chamber. The apparatus alignment procedures are discussed and a method given for finding the relevant orientation matrix under the conditions of Laue scattering to a fixed detector. The method also finds the zero positions of the orienter and is not confined to diffuse-scattering applications.
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  • 36
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    Applied crystallography online 25 (1992), S. 268-273 
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    Notes: Construction and performance of a spectrometer based on a high-voltage generator and W-anode X-ray tube are described. W Kα1 radiation is monochromated using a bent Ge (400) crystal. The obtained monochromatic flux is 107 photons s−1 and the beam size at the focal point 15 × 0.5 mm. Comparison is made with a 241Am γ-ray source, which has an almost equal photon energy. The W Kα1 beam does not exhibit the low-energy tail typical for the γ-ray source but, on the other hand, a small contribution of doublet energy was observed. Directional Compton profiles of pyrolytic graphite were measured with both sources and essentially the same features were found.
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  • 37
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    Applied crystallography online 25 (1992), S. 259-267 
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    Notes: The orientation distribution function (ODF) of the crystallites of polycrystalline materials can be calculated from experimentally measured pole density functions (pole figures). This procedure, called pole-figure inversion, can be achieved by the series-expansion method (harmonic method). As a consequence of the (hkl)-({\bar h}{\bar k}{\bar l}) superposition, the solution is mathematically not unique. There is a range of possible solutions (the kernel) that is only limited by the positivity condition of the distribution function. The complete distribution function f(g) can be split into two parts, \tilde {f}(g) and \tildes {f}(q), expressed by even- and odd-order terms of the series expansions. For the calculation of the even part \tilde {f}(g), the positivity condition for all pole figures contributes essentially to an `economic' calculation of this part, whereas, for the odd part, the positivity condition of the ODF is the essential basis. Both of these positivity conditions can be easily incorporated in the series-expansion method by using several iterative cycles. This method proves to be particularly versatile since it makes use of the orthogonality and positivity at the same time. In the previous paper in this series [Dahms & Bunge (1989) J. Appl. Cryst. 22, 439–447] a general outline of the method was given. This, the second part, gives details of the system of programs used as well as typical examples showing the versatility of the method.
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  • 38
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    Applied crystallography online 25 (1992), S. 251-258 
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    Notes: A powder diffractometer (CPS120 by INEL) equipped with a position-sensitive detector covering 120° in 2θ has been tested and the data have been successfully used with the Rietveld method. The detector was found to have a characteristic variation in linearity of ±1.5%. A calibration compound with well known 2θ values was used to determine a cubic spline calibration function to describe the 2θ versus channel-number function, which was then incorporated in the Rietveld analysis program. A procedure is also described to correct for air and capillary scattering, taking sample absorption into account. The methods have been applied to a structure refinement of quartz and to a study of the dehydration process of the zeolite thomsonite. Quartz: Rp = 11.0%, Rw = 14.0% and RB = 7.9%, based on 10 〈 2θ 〈 116.3° in 3470 steps, λ = 1.540598 Å. Space group P312, Z = 3, a = 4.91201 (7), c = 5.40301 (5) Å, x(Si) = 0.4702 (3), Bave(Si) = 0.77 (6) Å2, x(O) = 0.4112 (6), y(O) = 0.2712 (5), z(O) = −0.2811 (4) and Bave(O) = 1.0 (1) Å2. Thomsonite: Rp = 8.18%, Rw = 11.04% and RB = 3.33%, based on 10 〈 2θ 〈 110° in 3270 steps. Space group Pncn, Z = 4, a = 13.0778 (3), b = 13.0398 (3) and c = 13.1970 (3) Å. The unit cell changes continuously with increasing dehydration temperatures up to 523 K, at which a = 12.9725 (3), b = 12.9537 (3) and c = 13.2288 (3) Å. In this first dehydration step, the W3 and W4 molecules coordinated to the Ca/Na site are lost and the Ca/Na and W1 sites are shifted approximately 0.3 Å from their original positions towards the framework O atoms. After dehydration at 573 K, the mode of unit-cell variations is changed: a = 12.908 (3), b = 13.039 (3) and c = 13.034 (3) Å. In this dehydration step, W1 is lost. The W2 site appears unaffected by the dehydration below 573 K. On dehydration above 573 K, the diffraction intensities decrease as the compound becomes amorphous.
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  • 39
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    Applied crystallography online 25 (1992), S. 231-236 
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    Notes: A new algorithm, direct intensity fitting, has been developed which performs a whole-pattern fitting for powder data. The algorithm is related to the fitting technique of Pawley [J. Appl. Cryst. 14, 357–361] but does not require start values for the intensities of the individual reflections. Comparative tests show that direct intensity fitting extracts more accurate intensities from a powder diffractogram and reduces the minimum peak distance for accurate data to half of the half-widths. The structure of the superconductor Ba2YCu3O8−x can be solved in a default direct-methods run with direct-intensity-fitting intensities extracted from a normal laboratory powder diffractogram.
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    Applied crystallography online 25 (1992), S. 285-293 
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    Notes: The parameters dmin and λmin, needed for the processing of synchrotron X-ray Laue patterns, may be estimated by simple formulae from the sizes of the clear gaps surrounding prominent zone lines in gnomonic projections. The estimation of λmax is similarly considered. Examples are given.
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    Applied crystallography online 25 (1992), S. 281-284 
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    Notes: A method for the least-squares rigid-body refinement of a general electron density model is described. The present formulation is different from a previously reported one in the computation of the derivatives of the calculated Fourier coefficients, which are derived analytically here. This, together with a judicious choice of the Fourier transform search arrays, makes the procedure extremely fast and sufficiently accurate. Although originally designed simply to optimize the values of the positional parameters obtained by Patterson search techniques, the method proved to be extremely efficient as an aid for evaluation of the correctness of potential molecular-replacement solutions.
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    Applied crystallography online 25 (1992), S. 274-280 
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    Notes: X-ray diffraction studies are made on ion-conducting potassium titanyl phosphate (KTP) crystals with in situ DC electric field along different crystallographic directions. The X-ray rocking curves recorded with an electric field along the polar b axis (which is the direction of ion conduction) show a strong enhancement of the 040 reflection intensity (reflecting planes normal to the b axis) whereas the h0l reflections (reflecting planes parallel to the polar axis) do not show any intensity change. For an electric field normal to the polar axis no intensity change, either in 040 or in h0l reflections, occurs. This observation is supplemented by X-ray topography. The 040 X-ray topographs recorded with in situ electric field along b exhibit strong extinction contrast in the form of striations parallel to the polar (ion-conduction) axis. The 040 intensity increase and the striation contrast are attributed to lattice deformation by the space-charge polarization due to the movement of the K+ ions under the influence of the electric field.
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    Applied crystallography online 25 (1992), S. 310-317 
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    Notes: A direct-methods package optimized for powder data is described. Omission of weak intensities and overlapping reflections can greatly influence the phasing process. Methods are proposed which reduce their adverse effects on the efficiency of direct procedures. The experimental tests prove that SIRPOW.91 is a useful tool for solving crystal structures from both neutron and X-ray powder data.
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    Applied crystallography online 25 (1992), S. 309-310 
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    Notes: Integrated intensities of Bragg reflections were measured with a triple-axis neutron spectrometer for powder samples of KxRb1−xCl for x = 0.5. The temperature factors were corrected for thermal diffuse scattering (TDS) and static contributions. The Debye temperature and the mean temperature factors obtained from these measurements are compared with the values obtained by other techniques and are found to be in good agreement. The Debye temperatures for RbCl (x = 0) and KCl (x = 1) determined by other authors were combined with these results and the concentration dependence of Θ in KxRb1−xCl, was found to be non-linear.
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    Applied crystallography online 25 (1992), S. 294-308 
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    Notes: A method is described whereby the unit cell of a crystal and its orientation can be determined from a single Laue diffraction pattern (in transmission). The axial ratios and interaxial angles can be determined precisely, but the absolute scaling of the cell depends upon the accuracy with which the minimum wavelength for the experiment is known. Several examples are given.
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    Applied crystallography online 25 (1992), S. 323-324 
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    Applied crystallography online 25 (1992), S. 317-322 
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    Notes: Numerical integration over an internal coordinate, which occurs in incommensurate structure refinement, has been reconsidered. An algorithm based on the fast Fourier transform has been implemented and tested. This new procedure is faster and more accurate, especially for highly anharmonic structures. In addition, the computing time is less sensitive with respect to the range of harmonics and accuracy.
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    Applied crystallography online 25 (1992), S. 324-325 
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    Applied crystallography online 25 (1992), S. 327-328 
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    Applied crystallography online 25 (1992), S. 326-327 
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    Applied crystallography online 25 (1992), S. 329-329 
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    Applied crystallography online 25 (1992), S. 391-399 
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    Notes: An investigation is carried out on the feasibility of calculating the diffuse scattering from computer simulations of crystals containing substitutional and displacement disorder which have hitherto been used in conjunction with optical transform methods to aid in the interpretation of observed X-ray diffraction patterns. A straightforward method of calculation based on direct Fourier summation of the simulated lattice is used instead of fast Fourier transform (FFT) techniques, which are not in general suited to this type of calculation. This computational method provides a number of advantages over the optical method. It allows calculation in three dimensions, more flexibility in the assignment of atomic positions and scattering power of the individual atoms involved and the computation can be made in absolute units allowing for direct comparison with data scaled to electron units. Comparison of the two techniques is presented using, as an example, a simulation of planar disorder in a synthetic mullite. It is found that calculated patterns of comparable quality to ones obtained optically are feasible using the current generation of computers. Nevertheless, the transforms can still consume considerable computational resources particularly when the extension to three dimensions is required.
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    Applied crystallography online 25 (1992), S. 400-408 
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    Notes: The EBSP (electron backscattering pattern) technique has been used to verify and to complete a study by Rouag [Thèse de Doctorat d'Etat (1988), University de Paris Sud, Orsay, France] concerning the influence of crystallographic texture and grain boundaries during abnormal growth of Goss grains in Fe-3%Si sheets, grade Hi-B. 1000 individual orientations have been measured at three levels: at the surface, at a fifth of the thickness from the surface and at the middle of the sheet. This technique allows the calculation of a true orientation distribution function (ODF), which is not possible using X-ray (or neutron) diffraction. Indeed, for X-ray diffraction, only the even part of the ODF can be determined. For the even part of the ODF, the results obtained by EBSPs are in good agreement with those obtained by X-ray diffraction and show the importance of the contribution of the odd part (about 20% of the true ODF). Then the minimal value of the orientation number is determined to assess an ODF statistic. This short study shows that it is useful to determine a minimum of 1000 measurements at each level. From these 3000 measurements, the nature of the grain boundaries is determined showing a good agreement with results obtained in the literature. In particular, it appears that the percentage of coincidence site lattice (CSL) boundaries, which is about 10%, does not depend on the sampling position. Moreover, another short study of the influence of orientation number on the nature of grain boundaries shows that a good representation is obtained if about 750 measurements are taken into account.
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    Applied crystallography online 25 (1992), S. 409-413 
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    Notes: The single-hit assumption for the response of a photographic emulsion to electrons leads to a simple relationship between the exposure and the measured optical densities with the saturation density of the emulsion as the only parameter. With the inverse of this saturation density as a least-squares variable of the corresponding multiplicative `blackness correction', this correction has been determined from data sets of gas electron diffraction plates of different exposures. For optical densities from our standard photometer procedure, the computed values of the saturation density are smaller than the real values for the plates used. The computed values increase with increasing optical density of the darkest plate applied and increase by reducing the amount of light scattered by the silver grains of the emulsion. Computer simulations indicate that relatively small changes in the direction of the specular optical densities would be necessary to obtain the agreement predicted by the single-hit assumption between the computed and the real saturation density. A good blackness correction for our standard procedures is easily obtained by least-squares calculations when plates of relatively high optical densities are included in the applied data set.
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    Applied crystallography online 25 (1992), S. 414-423 
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    Notes: X-ray Laue diffraction patterns with an exposure time of 120 ps have been obtained from single crystals of an indole alkaloid and of the enzyme lysozyme using the X-rays emitted as a single bunch of electrons traverses a hard X-ray undulator inserted in CESR, the Cornell Electron–Positron Storage Ring. The patterns were recorded on a sensitive storage-phosphor detector. Despite complexities posed by the sharp variation of the incident X-ray spectrum with wavelength and the weakness of the diffraction patterns, accurate crystallographic structure amplitudes were extracted from the Laue intensities by the generalized scale-factor approach to the determination of the wavelength- and position-dependent correction factors. The results show that crystallography is feasible on the 100 ps time scale and open up the prospect of time-resolved measurements of ultra-rapid changes in molecular structure.
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    Notes: A feasibility study of an X-ray experiment is presented by which the lattice parameter of a silicon wafer relative to that of a perfect reference silicon crystal can be measured with a precision of 10−7. A multicrystal geometry in the symmetric Bragg case is proposed, using a monolithic monochromator as a beam splitter. Sample and analyser crystals are aligned with respect to the monochromator and the rotation of the analyser around its Bragg position produces two diffraction peaks. Their separation is related to the difference between the lattice parameters of monochromator and sample. The sample can be a piece of any commercial slice, generally cut from the ingot with an angle between the surface normal and the nominal crystallographic orientation and bent due to the mirror finishing on only one side. Moreover, the bending can be induced by layers grown on the surface by the processes of planar technology. Miscutting angle and curvature influence the diffraction peak position. The X-ray tracing and the procedure chosen for measurement eliminate these effects.
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    Applied crystallography online 25 (1992), S. 439-439 
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    Topics: Geosciences , Physics
    Notes: Corrected Figs. 4 and 5 for the paper by Servidori, Cembali, Fabbri & Zani [J. Appl. Cryst. (1992). 25, 46–51] are given.
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    Applied crystallography online 25 (1992), S. 432-438 
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    Notes: The 220 reflectivity curve of a 4 mm thick Si crystal is measured in asymmetric transmission (Laue) geometry. The crystal is bent to a radius varying from 24 to 138 m, and the analyzer is a nearly perfect Si(220) crystal in non-dispersive (+, −) arrangement. The full width at half-maximum of the reflectivity curves varies from 61 to 10 μrad, while that of a flat perfect crystal is 1.2 μrad, and the observed maximum reflectivity is about 60%. The calculated value is even higher, exceeding 80%. The bent crystal is used as an inverse-Cauchois monochromator, where the source of radiation is on the focusing circle. The effect of the beam divergence on the energy bandpass is eliminated, leaving only the contribution of the reflectivity curve. This can be matched to the desired resolution of the experiment by the choice of the thickness and asymmetry angle of the crystal. Compton-profile measurements from Ag and Au foils are used for a comparison of different monochromators. The bent-crystal monochromator provides 50 times more flux than the perfect Si(220) crystal and a better energy resolution than heat-treated Si(220) or mosaic Ge(220) crystals.
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    Applied crystallography online 25 (1992), S. 504-513 
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    Notes: The ability of the maximum-entropy method to determine accurate particle size distributions from small-angle scattering data is examined in detail. The well known commercial software package MEMS YS2 has been used for the core of the maximum-entropy algorithm to enable the results to be most generally applicable. Differences in its ability to reproduce number, mass and intensity distributions from simulated data are presented. Results for a maximum-entropy-method analysis of experimental small-angle neutron scattering data are examined for self-consistency and agreement with dynamic light scattering data.
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    Applied crystallography online 25 (1992), S. 611-616 
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    Notes: A texture model suitable for use in Rietveld-refinement programs is proposed. It is based on the series expansion of the pole distribution function in symmetrized harmonics. The model was tested on a textured plate sample of Al2O3.
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    Applied crystallography online 25 (1992), S. 617-623 
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    Topics: Geosciences , Physics
    Notes: The crystal structure of lithium diborate hydrate, LiB2O3(OH).H2O, has been solved ab initio and refined by the Rietveld method from powder diffraction data collected with a curved position-sensitive detector (INEL CPS120) using Debye–Scherrer diffraction geometry with monochromatic X-rays. In the first stage the indexing of the powder pattern was performed by the successive dichotomy method from data collected with a diffractometer using Bragg–Brentano geometry. The lattice parameters are a = 9.7984 (10), b = 8.2759 (7) and c = 9.6138 (8) Å and the space group is Pnna. The structural model was obtained from direct methods and two difference Fourier maps. The Rietveld refinement converged to final crystal structure and profile indicators RF = 0.05, RB = 0.05, Rp = 0.03 and Rwp = 0.04. The structure consists of BO4 tetrahedra (T) and BO2(OH) triangles (&Dgr;) sharing corners in order to form infinite chains along [010], with the shorthand notation 3:∞1(&Dgr; + 2T). The particular linkage of the B3O3 rings leads to a new diborate anion {[B2O3(OH)]n−n}, in which two tetrahedral B atoms have an occupation factor of 0.5. Li atoms, tetrahedrally surrounded by four O atoms, three belonging to separate chains and one to a water molecule maintain the cohesion of the structure.
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    Applied crystallography online 25 (1992), S. 624-627 
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    Notes: An experimental verification of the method of investigating texture inhomogeneity in the near-surface layers of a flat sample using the X-ray technique is presented. The investigations were performed on deformed aluminium. The results show that this method can be applied when finding the texture of the layers in the material is essential. Some limitations in the application of this method are due to its sensitivity to measurement errors.
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    Applied crystallography online 25 (1992), S. 628-631 
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    Notes: Powder diffraction data collected in transmission mode require an accurate value of sample absorption factor (μt) if the data are to be used quantitatively, e.g. for Rietveld refinement. When a primary-beam monochromator is in use, the direct beam may not be truly monochromatic, but rather consist of a series of harmonics of the desired wavelength. The intensity of these harmonics depends on instrumental parameters, but is sample independent. The contributions of these harmonics will result in incorrect values of μt for the primary wavelength if this is measured simply by determining the absorption of the direct beam by the sample at a single value of sample angle ω. The true value of μt may be determined by measuring the absorption over a range of ω and then fitting the data to the expression I(ω) = I0[F1 exp (− μt/cos ω) + (1 − F1) exp (− μt/cos ω) ], where μt and μ't are the absorption factors for the primary component and the higher harmonics, respectively, and F1 is the proportion of the primary component in the (attenuated) direct beam. Neglect of this effect will result in serious underestimation of μt; Rietveld refinement of data using such an incorrect value of μt will result in (in particular) unrealistic values of the thermal vibration parameters.
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    Applied crystallography online 25 (1992), S. 632-637 
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    Notes: Crystallographic unit cells can be characterized by vectors in Euclidean six-dimensional space, with components derived from the Niggli matrices. All non-triclinic Bravais-lattice types are represented by vectors from one-, two-, three- and four-dimensional specific linear subspaces. Projection matrices onto these subspaces were derived. The distance between an experimentally determined and reduced cell and the projection onto each subspace can be easily calculated and used to select the correct Bravais lattice. Presented results are numerically exact.
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    Applied crystallography online 25 (1992), S. 638-645 
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    Notes: The detective quantum efficiency (DQE) characterizes the measurement uncertainty introduced by a detector. A formulation of the DQE for CCD and vidicon-based X-ray integrating detectors is developed and illustrated with five model detectors. A comparison of the calculated and measured DQEs for two of these detectors is presented. From an examination of the DQEs for the model detectors, generalizations are made regarding detector designs.
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    Applied crystallography online 25 (1992), S. 646-647 
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    Notes: A new method of background correction of small-angle X-ray scattering (SAXS) intensities scattered by semicrystalline materials is proposed. The intensities scattered by the sample when in the amorphous state were taken as the background scattering. This method was applied to background correction of the SAXS intensities scattered by aged nylon 1010 and the width of the transition layer between crystalline and amorphous phase was determined to be 2.0 nm.
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    Applied crystallography online 25 (1992), S. 737-743 
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    Notes: The crystal symmetry of the mineral chalcopyrite has been investigated using Kikuchi-line intersections. It has been found that Kikuchi lines which intersect within systematic rows of reflections are very sensitive to small differences in interplanar spacings and can be used for symmetry determination. A small displacement of the point of intersection of the Kikuchi lines 3,3,{\bar 1} {\bar 4} and {\bar 3}7{\bar 6} within the 02{\bar 4} and 0{\bar 2}4 systematic row of Kikuchi reflections was seen, indicating that the 02{\bar 4} and 0{\bar 2}4 Kikuchi lines do not lie on a mirror plane. Similar observations were also made for the intersection points of the {\bar 3}, {\bar 1}, 10, 3{\bar 5}2 and {\bar 5}, {\bar 1}, 14, 5{\bar 7}2 Kikuchi lines within the 02{\bar 4} and 0{\bar 2}4 systematic row of reflections. The Kikuchi lines intersecting within the 0h0 systematic rows of reflections showed no displacements, which is consistent with the point group, {\bar 4}2m, of chalcopyrite. The antiferromagnetic superstructure of chalcopyrite has also been investigated. Dark-field transmission electron microscope (TEM) images obtained with the 110 superstructure reflection showed antiferromagnetic domains, which altered their configurations on heating by the electron beam. The alterations were reversible and were interpreted as originating from magneto-elastic deformation.
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    Applied crystallography online 25 (1992), S. 801-802 
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    Notes: In the paper by Butler & Welberry [J. Appl. Cryst. (1992), 25, 391–399], the half-tone figures (Figs. 2, 4, 5 and 6) were poorly reproduced by the printer. These figures are published here with better reproduction.
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    Applied crystallography online 25 (1992), S. 807-808 
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    Applied crystallography online 25 (1992), S. 803-806 
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    Notes: The crystal structures of a large number of proteins and nucleic acids are known and the corresponding sets of coordinates are stored in the Brookhaven Protein Data Bank. For structure investigations of biological macromolecules in solution, scattering and hydrodynamical methods are powerful biophysical tools when starting the data interpretation on the basis of the crystal structure of the molecules. The database BIOSCAT covers the main structural parameters estimable by X-ray scattering, translation and rotation diffusion methods and the X-ray scattering intensities and low- and high-resolution real-space electron distance distribution functions of 70 biological macromolecules and of oligonucleotides in standard conformation. The parameters and the scattered intensities are calculated from the atomic coordinates using the improved cube method and the real-space functions are estimated via a termination-error-reduced Fourier sine transformation. The database access is organized by the program PASSDB, which can generally be used for `readable' databases. A simple query language allows enquiries into the database without knowledge of a programming language. The program CONVSQL converts the database into normalized relations that can be handled by structured query languages (SQLs).
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    Applied crystallography online 25 (1992), S. 812-812 
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    Applied crystallography online 25 (1992), S. 809-811 
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    Notes: The program WEIS is used for the processing of macromolecular diffraction data recorded on a Weissenberg camera. Modifications have been made to WEIS in order to improve the number and quality of data obtained from integration over the diffraction peaks. Additional refinable parameters have been incorporated into the program in order to take account of small misalignments of the camera. Inclusion of these parameters in the refinement of the setting parameters results in a significantly better fit between the simulated and actual patterns. The modified program was used to process a set of diffraction data that had been collected using synchrotron radiation as the X-ray source and imaging plates as detectors. Improvement in the quality of the data was indicated by a significant increase in the number of accepted reflections per plate.
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    Acta crystallographica 48 (1992), S. 6-8 
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    Acta crystallographica 48 (1992), S. 4-5 
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