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  • Articles  (100)
  • Other Sources
  • Oxford University Press  (100)
  • American Geophysical Union
  • American Institute of Physics (AIP)
  • American Physical Society
  • Blackwell Publishing Ltd
  • Institute of Physics
  • Springer
  • 2000-2004  (100)
  • 1945-1949
  • 2000  (100)
  • Journal of Electron Microscopy. 2000; 49(1): 1-4. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023774.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 101-121. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023775.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 123-134. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023776.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 135-141. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023777.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 143-148. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023778.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 149-155. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023779.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 157-162. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023780.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 163-172. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023781.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 17-24. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023782.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 173-177. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023783.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 179-183. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023784.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 185-193. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023785.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 195-202. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023786.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 203-208. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023787.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 25-29. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023788.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 31-39. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023789.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 41-52. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023790.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 5-16. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023791.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 53-59. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023792.  (1)
  • Journal of Electron Microscopy. 2000; 49(1): 61-65. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023793.  (1)
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  • Natural Sciences in General  (100)
  • Physics  (100)
  • Electrical Engineering, Measurement and Control Technology  (100)
Collection
  • Articles  (100)
  • Other Sources
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  • Oxford University Press  (100)
  • American Geophysical Union
  • American Institute of Physics (AIP)
  • American Physical Society
  • Blackwell Publishing Ltd
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Years
  • 2000-2004  (100)
  • 1945-1949
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  • Natural Sciences in General  (100)
  • Physics  (100)
  • Electrical Engineering, Measurement and Control Technology  (100)
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