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  • Articles  (9)
  • Articles: DFG German National Licenses  (9)
  • AFM  (9)
  • Wiley-Blackwell  (9)
  • 1995-1999  (9)
  • 1985-1989
  • 1997  (9)
  • Physics  (9)
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  • Articles  (9)
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  • Articles: DFG German National Licenses  (9)
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  • 1995-1999  (9)
  • 1985-1989
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  • Physics  (9)
  • 1
    Electronic Resource
    Electronic Resource
    Fractal Dimension of Thin-film Surfaces Obtained by Fourier Spectral Analysis (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 488-491 
    Details
    ISSN: 0142-2421
    Keywords: fractal dimension ; Fourier spectral analysis ; STM ; AFM ; thin films ; magnetron sputtering ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The applicability of models based on fractal geometry to characterize thin-film surfaces was investigated. The fractal geometry of sputtered chromium nitride and silicon nitride thin-film surfaces was described using Fourier spectral analysis of profiles from scanning tunnelling microscopy images and atomic force microscopy images.The CrNx and SiNx coatings were deposited on silicon wafers using reactive magnetron sputtering and varying the gas pressure. The columnar structure of the amorphous silicon nitride varied with deposition, similar to the structure of the polycrystalline chromium nitride films.The fractal dimension decreases with increasing pressure. Films with fine columnar structures are characterized by a larger fractal dimension than films with coarse columnar structures.© 1997 John Wiley & Sons, Ltd.
    Additional Material: 5 Ill.
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  • 2
    Electronic Resource
    Electronic Resource
    A combination of SFM and TOF-SIMS imaging for observing local inhomogenieties in morphology and composition: aged calcite surfaces (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 959-965 
    Details
    ISSN: 0142-2421
    Keywords: SFM ; scanning force microscopy ; AFM ; atomic force microscopy ; TOF-SIMS ; time-of-flight secondary ion mass spectrometry ; spectroscopy ; imaging ; calcite ; CaCO3 ; calcium carbonate ; monovalent ions ; chloride ; sodium ; potassium ; fluoride ; solid-state diffusion ; fluid inclusions ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Because of their extremely high surface sensitivity, time-of-flight secondary ion mass spectrometry (TOF-SIMS) and scanning force microscopy (SFM) have been used in combination to provide complementary information about the chemical and morphological behaviour of calcite (CaCO3) surfaces during exposure to air. To allow time-resolved analysis of identical features with both techniques in turn, two types of orientation markers were used: pits etched with the Ga+ beam and naturally distinctive features of the surface. Freshly cleaved calcite surfaces had atomically flat cleavage terraces that were chemically homogeneous, whereas during aging for several months in air, monovalent salt crystallites (Na, K, Cl, F) developed spontaneously along intersecting cleavage directions. Contamination from external sources has been shown to be unlikely. No micro- or nanometre scale fractures have ever been observed in any of the single crystal samples examined, so the material has been interpreted to have diffused from the bulk, probably along crystal lattice defects. © 1997 John Wiley & Sons, Ltd.
    Additional Material: 8 Ill.
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  • 3
    Electronic Resource
    Electronic Resource
    Force Modulation AFM of Elastomer Blends: Morphology, Fillers and Cross-linking (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 418-429 
    Details
    ISSN: 0142-2421
    Keywords: AFM ; elastomer ; morphology ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In order to determine and optimize structure-property relationships in polymer blends, a knowledge of microscopic morphology and physical properties is essential. However, much of this microscopic morphology and physical property information has not been readily available using conventional characterization techniques. In this work, the capability of force modulation atomic force microscopy (AFM) for determining the detailed microstructure and physical properties of industrial polymer blends is evaluated for the first time. When combined with cryogenic facing, force modulation mapping is shown to be a very valuable microcharacterization technique that has a wide range of applicability. The modulus contrast obtained in the analysis of blends and composites allows one to distinguish polymer phases and related morphology with ease and with good specificity. This capability is demonstrated on a variety of filled and unfilled elastomer/plastic and elastomer/elastomer blends. In addition, analyses are successfully performed on a variety of blends containing isobutylene-based polymer that cannot be unambiguously characterized by electron microscopy techniques (isobutylene-based polymers rapidly degrade under electron bombardment). Force modulation mapping is also shown to be quite useful in distinguishing different types of fillers and their distributions in different polymer domains. Moreover, the capability of force modulation mapping for determining microscopic changes in cross-link density is examined. Examples of cross-linking mapping are presented for NR/BIMS, PP/EPDM and BIMS/BR blends. Finally, a semiquantitative calibration of relative force modulation amplitude vs. NR cure state is presented. All of these types of analyses are obtained without a need for the topographical contrast required by conventional AFM techniques and without the need for the complicated and time-consuming etching, staining and cryosectioning (thin films) typically required by electron microscopy techniques. © 1997 John Wiley & Sons, Ltd.
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  • 4
    Electronic Resource
    Electronic Resource
    Scanning Near-field Optical Microscope: a Method for Investigating Chromosomes (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 510-513 
    Details
    ISSN: 0142-2421
    Keywords: chromosome ; DNA ; karyotype ; Giemsa ; propidium iodide ; scanning near-field optical microscope ; SNOM ; NSOM ; scanning force microscope ; SFM ; AFM ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Karyotypes of human metaphase chromosomes are used to detect genetic defects like deletions or translocations. For these investigations the chromosomes are treated by the trypsin-Giemsa protocol, resulting in a typical banding pattern. These patterns are investigated using conventional light microscopy. Because of the diffraction limit, even the smallest visible band contains 1 million base pairs. We want to improve resolution by using bright-field scanning near-field optical microscopy (SNOM). Images of trypsin-Giemsa-treated chromosomes are presented and compared with conventional light microscopic, scanning force and scanning fluorescence near-field optical microscopic data. For fluorescence investigations, the chromosomes were stained using propidium iodide. To our knowledge, it is the first attempt to investigate G-banded chromosomes by SNOM.© 1997 John Wiley & Sons, Ltd.
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  • 5
    Electronic Resource
    Electronic Resource
    Topographic Correction of 3D SIMS Images (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 788-789 
    Details
    ISSN: 0142-2421
    Keywords: SIMS ; topography ; AFM ; imaging ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In order to provide an accurate rendition of a three-dimensional (3D) volume obtained by SIMS, it is necessary to take account of the topography of the original surface and the relative sputter rates of the different structures within the volume. We describe a method that corrects both distortions to 3D SIMS images. An atomic force microscope is used to produce a topographic images of the area analysed by SIMS, both before and after the depth profile. This information is convoluted with the 3D SIMS image to produce a correct 3D image of the changes in composition within the volume of the material. © 1997 by John Wiley & Sons, Ltd.
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  • 6
    Electronic Resource
    Electronic Resource
    AFM Characterization of Ta-based Diffusion Barriers for Use in Future Semiconductor Metallization (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 522-528 
    Details
    ISSN: 0142-2421
    Keywords: Ta ; diffusion barriers ; nanocrystalline films ; amorphous films ; AFM ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In this paper the investigation of r.f.-sputter-deposited Ta, Ta-N and Ta-N-O thin films is presented. Using atomic force microscopy in combination with sheet resistance measurements, Auger electron spectroscopy and x-ray diffraction, the thin film properties and microstructure are examined. Two crystalline modifications of Ta (tetragonal β-Ta and bcc α-Ta) are reported. By incorporation of nitrogen and/or oxygen into the Ta films, nanocrystalline and quasi-amorphous structures can be achieved. Finally, the usefulness of the films as diffusion barriers in Cu-based metallization systems is described.© 1997 John Wiley & Sons, Ltd.
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  • 7
    Electronic Resource
    Electronic Resource
    An XPS and AFM study of polypyrrole coating on mild steel (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 837-854 
    Details
    ISSN: 0142-2421
    Keywords: polypyrrole ; toluene sulphonate ; steel ; AFM ; XPS ; morphology ; interface ; corrosion ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We have characterized electrically conductive polymer, polypyrrole (Ppy), films on mild steel with atomic force microscopy (AFM) and x-ray photoelectron spectroscopy (XPS). The Ppy films were polymerized electrochemically from sodium p-toluene sulphonate (ToS) water-ethanol solution. A very good corrosion protective effect of those films on mild steel has been observed previously. After drying in air, thin Ppy films (∽200 nm) were highly adhesive, whereas thicker films (∽7.5 μm) could easily be peeled off from the metal. All films had a nodular surface structure. Thin films were very smooth and their roughness increased with their thickness. The AFM study of the interface between the metal and the polymer showed areas of different morphology, which suggests that adhesive and cohesive failure of the polymer film occurs. A strong variation of the chemical composition at the interfacial layer was observed. A sulphur-rich layer was formed at the interface, indicating that the counter-anions (ToS) were accumulated on the surface of the metal. High-binding energy iron and imine-type nitrogen were detected in a thin Ppy film. Moreover, thin films were substantially overoxidized. The number of anions incorporated into the Ppy matrix varied as a function of film thickness: the ‘doping level’ was about 30% for thicker films and only 12% for thin ones. Nitrate counter-anion-containing Ppy films were also studied in some cases for comparison. © 1997 John Wiley & Sons, Ltd.
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  • 8
    Electronic Resource
    Electronic Resource
    Model for Analysis of XPS Electron Take-off Angle Experiments in Layer-structured Samples: Determination of Attenuation Lengths in a Well-characterized Langmuir-Blodgett Film (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 650-659 
    Details
    ISSN: 0142-2421
    Keywords: XPS ; electron take-off angle ; layered structure ; attenuation length ; Langmuir-Blodgett film ; AFM ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A series of equations have been proposed to calculate take-off angle dependency of the elemental composition of layer-structured models from the experimentally obtained peak intensities of XPS. We have measured the take-off angle dependency of XPS peaks of O 1s, C 1s, Si 2p and Cd 3d from a well-characterized one-layer Langmuir-Blodgett (LB) film of polymerized cadmium 10,12-pentacosadiynoate on a silicon wafer substrate and have applied the newly proposed equations to deduce attenuation lengths of photoelectrons for every element in the layer-structured organic materials. From the best fitting between the theoretically calculated and the experimentally obtained data by the least-squares method, attenuation lengths for a monolayer film of polymerized cadmium 10,12-pentacosadiynoate have been evaluated to be 3.4, 3.7, 4.0 and 4.5 nm for the respective photoelectrons of O 1s (955 eV), Cd 3d5/2 (1082 eV), C 1s (1202 eV) and Si 2p (1388 eV) with the kinetic energy dependency of E0.75. It is essential to use polymerized LB films and to confirm the surface structure of the film directly by suitable techniques such as atomic force microscopy, scanning electron microscopy or transmission electron microscopy.© 1997 by John Wiley & Sons, Ltd.
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  • 9
    Electronic Resource
    Electronic Resource
    Investigation of Electrical Double Layers on SIO2 Surfaces by Means of Force vs. Distance Measurements (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 543-547 
    Details
    ISSN: 0142-2421
    Keywords: AFM ; force measurement ; liquid cell ; SiO2 ; tip modification ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The formation of electrical charges at solid/liquid interfaces results in a diffuse electrical double layer close to the solid surface. This layer determines, for example, the behaviour of ceramic particles in aqueous media and the effective pore radius of membranes acting in liquids. The SiO2/SiO2 system is used to demonstrate that linear measurements using atomic force microscopy are suited for characterizing double layers at real surfaces. It has to be taken into consideration that the tip itself, which is acting as the probe, is also surrounded by a double layer and responds to the composition of the electrolyte in a material-specific way. For this reason an oxidized silicon tip was used for the present investigations, so that tip and sample consisted the same material. In this way it is possible to obtain results that can be evaluated easily and compared with the DLVO theory.© 1997 John Wiley & Sons, Ltd.
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