Publication Date:
2014-03-21
Description:
Author(s): S.-W. Chen, X. Lu, E. Blackburn, V. Lauter, H. Ambaye, K. T. Chan, E. E. Fullerton, A. E. Berkowitz, and S. K. Sinha We have measured the interfacial magnetization depth profile in ferromagnet/antiferromagnet exchange-coupled NiFe/CoO bilayers. Both a polycrystalline and an epitaxial-(111) bilayer were examined. We find that the nonswitchable magnetization profile in the biased state is highly correlated with the ... [Phys. Rev. B 89, 094419] Published Thu Mar 20, 2014
Keywords:
Magnetism
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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