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  • American Institute of Physics (AIP)  (5)
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  • 1
    Electronic Resource
    Electronic Resource
    A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2870-2873 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A lateral sample modulation technique is presented to measure simultaneously lateral friction forces and topological features with an atomic force microscope (AFM). The employed technique allows one to use an AFM without any additional displacement sensor. This dynamic detection scheme is well suited for AFMs equipped with a fiber-optic displacement sensor. The technique and the mechanism of the contrast formation are discussed. The performance of the microscope is demonstrated by imaging flat surfaces and large corrugated films as well as low friction samples.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144630
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  • 2
    Electronic Resource
    Electronic Resource
    Improved microtips for scanning probe microscopy (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2538-2541 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Improved electrochemical techniques for the reproducible fabrication of sharp metallic tips are presented. Radii of curvature down to 10 nm make the tips particularly suitable for scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Additionally, simple methods are developed for preparing AFM cantilevers. A new type of spherical probe suitable for long-range scanning force microscopy has been fabricated. The probes consist of nearly perfect spheres with adjustable radii between about 50 and several 100 nm deposited at the very tip of tiny probe holders. Both probe and probe holder may consist of any metal. First experimental investigations confirm that the spherical probes are particularly suitable for van der Waals and magnetic force microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141911
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  • 3
    Electronic Resource
    Electronic Resource
    Friction contrast in resonant cantilever vibration mode (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 501-503 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dynamic scanning friction microscopy technique is based on a well-known lateral sample modulation technique combined with a lock-in amplifier. In this paper, we describe a modified detection scheme in the resonant regime of a cantilever's bending mode. This resonant mode leads to a couple of advantages in the imaging mode especially applicable under ultrahigh vacuum conditions, as well as an additional spectroscopy mode by measuring the resonance curve. An interpretation of the resonance curves and the images in terms of the friction losses is given, taking into account the cantilever vibration and the observed nonlinear characteristic of the stick–slip interaction. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.127024
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  • 4
    Electronic Resource
    Electronic Resource
    Probe calibration in magnetic force microscopy (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 2612-2614 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Quantitative image interpretation in magnetic force microscopy requires information about the geometric and magnetic configuration of the employed microprobe. If the magnetic microfield of a given sample is known in detail, a calibration of the probe is possible. Using the well-defined current-induced microfield of a nanolithographically structured conducting pattern, calibration measurements combined with model calculations provide an insight into the effective domain configuration of magnetic force microscopy probes.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.103827
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  • 5
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy of domain wall stray fields on single-crystal iron whiskers (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 2578-2580 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using a capacitively controlled force microscope we have imaged typical domain wall configurations like 90° closure structures and subdivided 180° wall segments in single-crystal iron whiskers. Differences in wall contrast between 90° and 180° domain walls are clearly observed. The effect of tip-to-sample distance on lateral resolution and wall contrast in magnetic force microscopy is shown.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102847
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