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  • American Institute of Physics (AIP)  (6)
  • 1
    Electronic Resource
    Electronic Resource
    Ultraviolet inverse photoemission spectrograph with parallel multichannel isochromat acquisition (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 639-642 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A simple and cost effective inverse photoemission spectrograph based on a spherical grating with very large optical acceptance ( f/2.8) is described. The system works in the 10–25 eV photon energy range. The dispersed photons are detected by a detector assembly based on a microchannelplate and consisting of twelve independent channels. Measurements are taken in the isochromat mode by sweeping the impinging electron energy, and the acquisition of the twelve channels is done in parallel. As an example of the apparatus performances data on polycrystalline Pt are presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142062
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  • 2
    Electronic Resource
    Electronic Resource
    New calibration procedure for an inverse photoemission spectrograph (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 4469-4470 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new calibration procedure for determining the instrumental efficiency of a grating-based inverse photoemission spectrograph is described. Our results are in good agreement with those obtained by following another procedure previously adopted by other authors. The new procedure is particularly convenient for inverse photoemission experiments conducted in the so-called "isochromat'' mode.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143703
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  • 3
    Electronic Resource
    Electronic Resource
    A double coil apparatus for Barkhausen noise measurements (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 2058-2061 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A pickup coil wound around the sample is the standard method for Barkhausen noise (BN) measurements. Here we describe an apparatus where two coils are used instead of one. The relative position of the coils can be changed and this allows the experimental investigation of spatial correlation effects in BN. The signals induced in the coils are very similar when the coils are placed nearby whereas a progressive decrease of their correlation is observed by moving the coils apart. We tested our system on a ribbon of amorphous Fe63B14Si8Ni15 100 mm long. For a distance between the coils of 40 mm the signal correlation is nearly vanished. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1353193
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  • 4
    Electronic Resource
    Electronic Resource
    A focused magneto-optical Kerr magnetometer for Barkhausen jump observations (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 1752-1755 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe a modified version of a magneto-optical Kerr magnetometer which allows measuring the hysteresis loop of a specific portion of the sample surface. The diameter of the sampled area can be optically tuned from several mm down to 15 μm. High quality hysteresis loops can be measured in a few seconds. Strong fluctuations are observed when the spot diameter is reduced to a few hundred microns or less. These fluctuations are related to the well-known Barkhausen noise here investigated for the first time in a systematic way using optical techniques. Preliminary data for epitaxial Fe grown on MgO are presented. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150532
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  • 5
    Electronic Resource
    Electronic Resource
    Annealing behavior of refractory metal multilayers on Si: The Mo/Ti and W/Ti systems (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 2414-2419 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Structures consisting of alternate layers of Mo/Ti and W/Ti have been sputter deposited on Si(100) substrates and their annealing behavior has been studied using Auger sputter profiling. The anneals were performed under typical processing conditions. Two major driving forces control the observed reactions: the silicidation of the metals and the oxidation of Ti. The prevalence of one of them depends both on the structure of the as-deposited film and on the annealing temperature. In the case where silicidation prevails a multisilicide layer is formed, with no alteration with respect to the initial disposition order of the metal films. Intermixing between the reacted layers starts to be observed at 900 °C. The behavior of common contaminants such as oxygen and carbon has been studied.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.341035
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  • 6
    Electronic Resource
    Electronic Resource
    Evolution of coercivity during the early stages of Fe80B20 crystallization (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 6920-6924 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a study of the evolution of coercivity (Hc) in partially crystallized Fe80B20 samples with an increasing number of crystallites obtained in a controlled way into ferromagnetic amorphous matrix. These samples allow to test existing models for interaction of domain walls with defects since it is possible to change only the number density of crystallites without modifying their dimensions. We observe that the evolution of Hc is mainly related to the nucleation frequency of grains and quite independent from their internal structure. The observed behavior of Hc can be accounted for by considering the dependence of coercivity on the number density of pinning sites and by assuming a two-dimensional bending of the domain walls during their motion. Moreover our results indicate that the changes occurring to the intergranular phase during annealing do not appreciably affect coercivity in the partially crystallized samples. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363765
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