Publication Date:
2011-08-20
Description:
Author(s): K. M. Seemann, F. Freimuth, H. Zhang, S. Blügel, Y. Mokrousov, D. E. Bürgler, and C. M. Schneider An angle dependent analysis of the planar Hall effect (PHE) in nanocrystalline single-domain Co 60 Fe 20 B 20 thin films is reported. In a combined experimental and theoretical study we show that the transverse resistivity of the PHE is entirely driven by anisotropic magnetoresistance (AMR). Our results ... [Phys. Rev. Lett. 107, 086603] Published Fri Aug 19, 2011
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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