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  • Articles  (32)
  • American Institute of Physics (AIP)  (30)
  • Springer Nature  (2)
  • American Physical Society (APS)
  • American Chemical Society
  • Electrical Engineering, Measurement and Control Technology  (32)
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  • Articles  (32)
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  • 1
    Electronic Resource
    Electronic Resource
    Measurement and interpretation of electron cyclotron emission on JET (abstract) (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 940-940 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The first two channels of the JET electron cyclotron emission diagnostic have been in regular use for several months. A Michelson interferometer provides several hundred broadband spectral measurements (with time resolution 15 ms) on every plasma pulse. The second cyclotron harmonic in these spectra is used to deduce absolutely calibrated electron temperature profiles in the outer half of the plasma. Current measurements and their interpretation will be discussed, and the full diagnostic system, for the determination of two-dimensional profiles, will be described.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138055
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  • 2
    Electronic Resource
    Electronic Resource
    The "Compact Toroid Injection Experiment" tomographic imaging system (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 4119-4126 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design, construction and operation of a tomographic imaging system on the Compact Toroid Injection Experiment is described. The system measures the total radiated power over energies from visible light up into the extreme ultraviolet. It then reconstructs two dimensional profiles from the data. The reconstruction routine is based on a method known as second order regularization which finds a compromise between smoothness and fit to the data. This method was found to have the best overall fidelity to test images. The hardware and overall reconstruction were calibrated using two different sources. First results from the system under real experimental conditions are presented. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1318920
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  • 3
    Electronic Resource
    Electronic Resource
    Obtaining absolute spatial flux measurements with a time-resolved pinhole camera (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 2012-2015 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A technique is described to determine the spatial x-ray flux emitted from a hohlraum wall and subsequently transmitted through a diagnostic hole. This technique uses x-ray diodes, bolometers, and a time-resolved pinhole camera to determine the spatial flux of x rays emitted through a hohlraum's diagnostic hole. The primary motivation for this analysis was the relatively long duration, nearly 100 ns, of the x-ray drive present in z-pinch driven hohlraums. This radiation causes plasma to ablate from the hohlraum walls surrounding the diagnostic hole and results in a partial obscuration that reduces the effective area over which diagnostics view the radiation. The effective change in area leads to an underestimation of the wall temperature when nonimaging diagnostics such as x-ray diodes and bolometers are used to determine power and later to infer a wall temperature. An analysis similar to the one described below is then necessary to understand the radiation environment present in x-ray driven hohlraums when these diagnostics are used and hole closure is important. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149703
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  • 4
    Electronic Resource
    Electronic Resource
    X-ray spectral power measurements utilizing the diffraction pattern of a slit (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 1624-1626 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An instrument is described which can obtain x-ray spectral power measurements utilizing the diffraction pattern produced when x rays pass through a slit. Traditionally, these types of measurements yielding low to moderate spectral resolution have been made with filtered x-ray diodes or with a transmission grating. The instrument described below has several advantages over filtered x-ray diodes in determining the spectral power profile such as an insensitivity to surface contamination. In addition, this instrument does not require the use of filters which can be destroyed during a shot making absolute measurements difficult and very time consuming. The advantages over a transmission grating system include cost, mechanical robustness, and fewer components which require spectral calibration. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149642
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  • 5
    Electronic Resource
    Electronic Resource
    A corona discharge probe system for measuring phase velocities in a dense suspension (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 3475-3477 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Measurement of distribution of velocities of phases in pipe flow of a dense gas-solid suspension was facilitated by the use of an ion source in the form of a localized corona discharge and a downstream traversing electrostatic probe. The system utilizes the transient behavior of a corona discharge which provides a distinction of times of arrival of ions and solid particles of modified charges at a downstream probe. This probe system does not suffer the handicap of other available probe systems in a dense solid phase.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140495
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  • 6
    Electronic Resource
    Electronic Resource
    The construction of a gas aggregation source for the preparation of size-selected nanoscale transition metal clusters (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3178-3183 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and operation of a gas aggregation source is described. The source combines the attributes of high-temperature operation (enabling preparation of transition metal clusters), mass selection, ultrahigh vacuum compatibility, and transportability. This makes it ideally suited to in situ studies such as scanning tunneling microscope or synchrotron radiation experiments. Data are presented to illustrate the performance of the source; recent results obtained in synchrotron radiation studies are highlighted. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1304868
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  • 7
    Electronic Resource
    Electronic Resource
    The construction of a gas aggregation source for the preparation of mass-selected ultrasmall metal particles (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1853-1857 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and operation of a high temperature gas aggregation source, capable of in situ deposition of mass-selected atomic clusters of transition metals onto a substrate in an ultrahigh vacuum chamber, is described. Mass-selection is achieved by an ultrahigh mass quadrupole filter operating at masses up to 3×104 amu. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147957
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  • 8
    Electronic Resource
    Electronic Resource
    An interactive impulse response extraction system (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 5092-5095 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A cross-correlation method of measuring the impulse response of linear systems is presented. In theory, by using this method, the impulse response of any linear system can be obtained while the system is being used under normal operation with no significant distortion of the normal system output. A cross-correlation system was modeled and constructed using discrete components and simulation and experimental results are presented. Unfortunately, these results show that the extracted impulse response is severely distorted by the normal system input and the system noise. However, by averaging and interleaving methods, the impulse response of any linear system can be extracted with a high degree of accuracy. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146134
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  • 9
    Electronic Resource
    Electronic Resource
    Series operation of power MOSFETs for high-speed, high-voltage switching applications (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 1655-1656 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Series operation of power metal-oxide semiconductor field-effect transistors (MOSFETs) to increase their effective hold off voltage is described. The design procedure presented is a modification of a recently reported [Baker and Johnson, Rev. Sci. Instrum. 63, 5799 (1992)] method. Comments are made on implementing MOSFET stacks in various types of instrumentation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144043
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  • 10
    Electronic Resource
    Electronic Resource
    An atomic oxygen environmental cell for a transmission electron microscope (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 1863-1868 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The capabilities of the transmission electron microscope have been extended to enable in situ studies of the interaction of atomic oxygen with various solids to be performed. This has been accomplished by modifying the specimen chamber region of a JEOL 200CX TEM/STEM electron microscope to accommodate a specially designed environmental cell and specimen heating stage. With this arrangement it is possible to continuously observe changes in the appearance of a specimen as it undergoes reaction with a beam of atomic oxygen. In this paper a description of the technique will be presented together with some applications which highlight its advantages over conventional transmission electron microscopic post-reaction examinations.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141109
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