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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 1863-1868 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The capabilities of the transmission electron microscope have been extended to enable in situ studies of the interaction of atomic oxygen with various solids to be performed. This has been accomplished by modifying the specimen chamber region of a JEOL 200CX TEM/STEM electron microscope to accommodate a specially designed environmental cell and specimen heating stage. With this arrangement it is possible to continuously observe changes in the appearance of a specimen as it undergoes reaction with a beam of atomic oxygen. In this paper a description of the technique will be presented together with some applications which highlight its advantages over conventional transmission electron microscopic post-reaction examinations.
    Type of Medium: Electronic Resource
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